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Kenneth S. Alexander

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Published work

10 published item(s)

preprint2016arXiv

Local asymptotics for the first intersection of two independent renewals

We study the intersection of two independent renewal processes, $ρ=τ\capσ$. Assuming that $\mathbf{P}(τ_1 = n ) = φ(n)\, n^{-(1+α)}$ and $\mathbf{P}(σ_1 = n ) = \tildeφ(n)\, n^{-(1+ \tildeα)} $ for some $α,\tilde α\geq 0$ and some slowly varying $φ,\tildeφ$, we give the asymptotic behavior first of $\mathbf{P}(ρ_1>n)$ (which is straightforward except in the case of $\min(α,\tildeα)=1$) and then of $\mathbf{P}(ρ_1=n)$. The result may be viewed as a kind of reverse renewal theorem, as we determine probabilities $\mathbf{P}(ρ_1=n)$ while knowing asymptotically the renewal mass function $\mathbf{P}(n\inρ)=\mathbf{P}(n\inτ)\mathbf{P}(n\inσ)$. Our results can be used to bound coupling-related quantities, specifically the increments $|\mathbf{P}(n\inτ)-\mathbf{P}(n-1\inτ)|$ of the renewal mass function.

preprint2016arXiv

Local limit theorems and renewal theory with no moments

We study i.i.d. sums $τ_k$ of nonnegative variables with index $0$: this means $\mathbf{P}(τ_1=n) = φ(n) n^{-1}$, with $φ(\cdot)$ slowly varying, so that $\mathbf{E}(τ_1^\varepsilon)=\infty$ for all $\varepsilon>0$. We prove a local limit and local (upward) large deviation theorem, giving the asymptotics of $\mathbf{P}(τ_k=n)$ when $n$ is at least the typical length of $τ_k$. A recent renewal theorem by Nagaev [21] is an immediate consequence: $\mathbf{P}(n\inτ) \sim \mathbf{P}(τ_1=n)/\mathbf{P}(τ_1 > n)^2$ as $n\to\infty$. If instead we only assume regular variation of $\mathbf{P}(n\inτ)$ and slow variation of $U_n:= \sum_{k=0}^n \mathbf{P}(k\inτ)$, we obtain a similar equivalence but with $\mathbf{P}(τ_1=n)$ replaced by its average over a short interval. We give an application to the local asymptotics of the distribution of the first intersection of two independent renewals. We further derive downward moderate and large deviations estimates, that is, the asymptotics of $\mathbf{P}(τ_k \leq n)$ when $n$ is much smaller than the typical length of $τ_k$.

preprint2014arXiv

Path properties of the disordered pinning model in the delocalized regime

We study the path properties of a random polymer attracted to a defect line by a potential with disorder, and we prove that in the delocalized regime, at any temperature, the number of contacts with the defect line remains in a certain sense "tight in probability" as the polymer length varies. On the other hand we show that at sufficiently low temperature, there exists a.s. a subsequence where the number of contacts grows like the log of the length of the polymer.

preprint2013arXiv

Controlled random walk with a target site

We consider a simple random walk W_i in 1 or 2 dimensions, in which the walker may choose to stand still for a limited time. The time horizon is n, the maximum consecutive time steps which can be spent standing still is m_n and the goal is to maximize P(W_n=0). We show that for dimension 1, if m_n grows faster than (\log n)^{2+γ} for some γ>0, there is a strategy for each n such that P(W_n = 0) approaches 1. For dimension 2, if m_n grows faster than a positive power of n then there are strategies keeping P(W_n=0) bounded away from 0.

preprint2013arXiv

Subgaussian concentration and rates of convergence in directed polymers

We consider directed random polymers in $(d+1)$ dimensions with nearly gamma i.i.d. disorder. We study the partition function $Z_{N,ω}$ and establish exponential concentration of $\log Z_{N,ω}$ about its mean on the subgaussian scale $\sqrt{N/\log N}$ . This is used to show that $\mathbb{E}[ \log Z_{N,ω}]$ differs from $N$ times the free energy by an amount which is also subgaussian (i.e. $o(\sqrt{N})$), specifically $O(\sqrt{\frac{N}{\log N}}\log \log N)$.

preprint2010arXiv

Equality of critical points for polymer depinning transitions with loop exponent one

We consider a polymer with configuration modelled by the trajectory of a Markov chain, interacting with a potential of form $u+V_n$ when it visits a particular state 0 at time $n$, with $\{V_n\}$ representing i.i.d. quenched disorder. There is a critical value of $u$ above which the polymer is pinned by the potential. A particular case not covered in a number of previous studies is that of loop exponent one, in which the probability of an excursion of length $n$ takes the form $ϕ(n)/n$ for some slowly varying $ϕ$; this includes simple random walk in two dimensions. We show that in this case, at all temperatures, the critical values of $u$ in the quenched and annealed models are equal, in contrast to all other loop exponents, for which these critical values are known to differ, at least at low temperatures.

preprint2010arXiv

Excursions and local limit theorems for Bessel-like random walks

We consider reflecting random walks on the nonnegative integers with drift of order 1/x at height x. We establish explicit asymptotics for various probabilities associated to such walks, including the distribution of the hitting time of 0 and first return time to 0, and the probability of being at a given height k at time n (uniformly in a large range of k.) In particular, for drift of form -δ/2x + o(1/x) with δ> -1, we show that the probability of a first return to 0 at time n is asymptotically n^{-c}ϕ(n), where c = (3+δ)/2 and ϕis a slowly varying function given explicitly in terms of the o(1/x) terms.

preprint2008arXiv

Quenched and Annealed Critical Points in Polymer Pinning Models

We consider a polymer with configuration modeled by the path of a Markov chain, interacting with a potential $u+V_n$ which the chain encounters when it visits a special state 0 at time $n$. The disorder $(V_n)$ is a fixed realization of an i.i.d. sequence. The polymer is pinned, i.e. the chain spends a positive fraction of its time at state 0, when $u$ exceeds a critical value. We assume that for the Markov chain in the absence of the potential, the probability of an excursion from 0 of length $n$ has the form $n^{-c}ϕ(n)$ with $c \geq 1$ and $ϕ$ slowly varying. Comparing to the corresponding annealed system, in which the $V_n$ are effectively replaced by a constant, it is known that the quenched and annealed critical points differ at all temperatures for $3/2<c<2$ and $c>2$, but only at low temperatures for $c<3/2$. For high temperatures and $3/2<c<2$ we establish the exact order of the gap between critical points, as a function of temperature. For the borderline case $c=3/2$ we show that the gap is positive provided $ϕ(n) \to 0$ as $n \to \infty$, and for $c >3/2$ with arbitrary temperature we provide a new proof that the gap is positive, and extend it to $c=2$.