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Performance Analysis of Boron Nitride Embedded Armchair Graphene Nanoribbon MOSFET with Stone Wales Defects

We study the performance of a hybrid Graphene-Boron Nitride {GNR-BN} armchair nanoribbon {a-GNR-BN} MOSFET at its ballistic transport limit. We consider three geometric configurations 3p, 3p+1 and 3p+2 of a-GNR-BN with BN atoms embedded on both sides {2, 4 and 6 BN on each side} on the GNR. The material properties like band gap, effective mass and density of states of these H-passivated structures have been evaluated using the Density Functional Theory {DFT}. Using these material parameters, self-consistent Poisson-Schrodinger simulations are carried out under the Non Equilibrium Greens Function {NEGF} formalism to calculate the ballistic MOSFET device characteristics. For a hybrid nanoribbon of width ~ 5 nm, the simulated ON current is found to be in the range 276 uA - 291 uA with an ON/OFF ratio 7.1 x 10^6 - 7.4 x 10^6 for a VDD = 0.68 V corresponds to 10 nm technology node. We further study the impact of randomly distributed Stone Wales {SW} defects in these hybrid structures and only 2.52% degradation of ON current is observed for SW defect density of 6.35%.