Abstract
There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback or can be used without access to the distal side of the scatterer. Among all the wave-front shaping techniques, retrieving the transmission matrix of a scattering material is the only one that allows for focusing on multiple spots after a single set of measurements. Here we propose a method to retrieve the transmission matrix of a scatterer using fluorescence light as feedback without access to the distal side. The advantage of this method is that it allows focusing on the whole field of view after a single matrix measurement without affecting the sample, making it suitable for reflection epi-illumination geometry microscopy.
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