Length-dependent resistance model for a single-wall Carbon nanotube

preprint2008arXivOpen access

Abstract

The non-linear length-dependent resistance, R(l)\mathcal{R}(l) observed in single-wall Carbon nanotubes (SNTs) is explained through the recently proposed ionization energy (EIE_I) based Fermi-Dirac statistics (iiFDS). The length here corresponds to the Carbon atoms number (N\mathcal{N}) along the SNT. It is also shown that Ry(ly)\mathcal{R}_y(l_y) << Rx(lx)\mathcal{R}_x(l_x) is associated with EIyE_I^y << EIxE_I^x, which can be attributed to different semiconducting properties in their respective yy and xx directions.

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