Abstract
Consider a set of multivariate distributions, , aiming to explain the same phenomenon. For instance, each may correspond to a different candidate background model for calibration data, or to one of many possible signal models we aim to validate on experimental data. In this article, we show that tests for a wide class of apparently different models can be mapped into a single test for a reference distribution . As a result, valid inference for each can be obtained by simulating \underline{only} the distribution of the test statistic under . Furthermore, can be chosen conveniently simple to substantially reduce the computational time.
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