Exchange Field-Mediated Magnetoresistance in the Correlated Insulator Phase of Be Films

preprint2012arXivOpen access

Abstract

We present a study of the proximity effect between a ferromagnet and a paramagnetic metal of varying disorder. Thin beryllium films are deposited onto a 5 nm-thick layer of the ferromagnetic insulator EuS. This bilayer arrangement induces an exchange field, HexH_{ex}, of a few tesla in low resistance Be films with sheet resistance R≪RQR\ll R_Q, where RQ=h/e2R_Q=h/e^2 is the quantum resistance. We show that HexH_{ex} survives in very high resistance films and, in fact, appears to be relatively insensitive to the Be disorder. We exploit this fact to produce a giant low-field magnetoresistance in the correlated insulator phase of Be films with R≫RQR\gg R_Q.

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