Evidence of defect-induced ferromagnetism in ZnFe2_{2}O4_{4} thin films

preprint2011arXivOpen access

Abstract

X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe2_{2}O4_{4} thin films. The spectroscopy techniques are used to determine the non-equilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 10−3^{-3} mbar cause iron superoccupation of tetrahedral sites without Zn2+^{2+} inversion, resulting in an ordered magnetic phase with high room temperature magnetic moment.

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