Abstract
We present measurements of anisotropic magnetoresistance of La_{0.75}Sr_{0.25}MnO_3 films deposited on (001) SrTiO_3 substrates, and develop a model to describe the low temperature AMR in manganites. We measure an AMR of the order of 10^{-3} for the current I parallel to the [100] axis of the crystal and vanishing AMR for I//[110], in agreement with the model predictions.
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