A digital oscilloscope setup for the measurement of a transistor's characteristics

preprint2010arXivOpen access

Abstract

The measure of the characteristics of a transistor is an important step in an introductory electronics course. We propose to use a digital oscilloscope with a USB connection to perform a measurement of the characteristic curves with no additional custom circuitry. The setup is presented alongside with code that allows the importation and analysis of the results with open-source software.

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