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R. Klanner
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R. Klanner13 visible / 13 total nodes / 12 links

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AuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipR. KlannerAR. KlannerResearcherCan the electric field in radiation-damaged silicon pad diodes be determined by admittance and current measurements?WCan the electric field ...preprint / 2021Study of the band-gap energy of radiation-damaged siliconWStudy of the band-gap e...preprint / 2022Determination of the electric field in highly-irradiated silicon sensors using edge-TCT measurementsWDetermination of the el...preprint / 2019Self-heating Effect in Silicon-PhotomultipliersWSelf-heating Effect in ...preprint / 2022A computer program to simulate the response of SiPMsWA computer program to s...preprint / 2020Precision measurement of the carrier drift velocities in <100> siliconWPrecision measurement o...preprint / 2015Influence of radiation damage on the absorption of near-infrared light in siliconWInfluence of radiation ...preprint / 2020Analysis methods for highly radiation-damaged SiPMsWAnalysis methods for hi...preprint / 2019Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD SimulationsWOptimization of the Rad...preprint / 2011Design of the AGIPD Sensor for the European XFELWDesign of the AGIPD Sen...preprint / 2012Study of the breakdown voltage of SiPMsWStudy of the breakdown ...preprint / 2016The influence of edge effects on the determination of the doping profile of silicon pad diodesWThe influence of edge e...preprint / 2016
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R. Klanner

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PaperCan the electric field in radiation-damaged silicon pad diodes be determined by admittance and current measurements?Authorship / preprint / 2021PaperStudy of the band-gap energy of radiation-damaged siliconAuthorship / preprint / 2022PaperDetermination of the electric field in highly-irradiated silicon sensors using edge-TCT measurementsAuthorship / preprint / 2019PaperSelf-heating Effect in Silicon-PhotomultipliersAuthorship / preprint / 2022PaperA computer program to simulate the response of SiPMsAuthorship / preprint / 2020PaperPrecision measurement of the carrier drift velocities in <100> siliconAuthorship / preprint / 2015PaperInfluence of radiation damage on the absorption of near-infrared light in siliconAuthorship / preprint / 2020PaperAnalysis methods for highly radiation-damaged SiPMsAuthorship / preprint / 2019

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