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Peter Grütter
Researcher
PaperComment on 'Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions'Authorship / preprint / 2013PaperImplementation of atomically defined Field Ion Microscopy tips in Scanning Probe MicroscopyAuthorship / preprint / 2012PaperDamping of a nanomechanical oscillator strongly coupled to a quantum dotAuthorship / preprint / 2009PaperTransient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metalsAuthorship / preprint / 2013PaperFIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusionAuthorship / preprint / 2013