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Jerzy Krupka
Researcher
PaperMicrowave properties of Yttrium Vanadate at cryogenic temperaturesAuthorship / preprint / 2012PaperLoss tangent measurements of dielectric substrates from 15 K to 300 K with two resonators: investigation into accuracy issuesAuthorship / preprint / 2012PaperComplex Permittivity Measurements at Variable Temperatures of Low Loss Dielectric Substrates Employing Split Post and Single Post Dielectric ResonatorsAuthorship / preprint / 2012PaperMicrowave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator techniqueAuthorship / preprint / 2012PaperPrecise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorAuthorship / preprint / 2012PaperSurface resistance measurements of HTS thin films using SLAO dielectric resonatorAuthorship / preprint / 2012PaperDetermination of the Anisotropy of Permittivity of Quantum Paraelectric Strontium TitanateAuthorship / preprint / 2015PaperDetrapping and retrapping of free carriers in nominally pure single crystal GaP, GaAs and 4H-SiC semiconductors under light illumination at cryogenic temperaturesAuthorship / preprint / 2010