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Eckhart Fretwurst
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AuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipEckhart FretwurstAEckhart FretwurstResearcherMeasurements of charge carrier mobilities and drift velocity saturation in bulk silicon of <111> and <100> crystal orientation at high electric fieldsWMeasurements of charge ...preprint / 2010Charge losses in segmented silicon sensors at the Si-SiO2 interfaceWCharge losses in segmen...preprint / 2012Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsWTime dependence of char...preprint / 2013Study of X-ray Radiation Damage in Silicon SensorsWStudy of X-ray Radiatio...preprint / 2011Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFELWInvestigation of X-ray ...preprint / 2012Study of X-ray radiation damage in the AGIPD sensor for the European XFELWStudy of X-ray radiatio...preprint / 2013Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron LaserWDesign and First Tests ...preprint / 2014Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type siliconWStudy of radiation dama...preprint / 2012Properties of a radiation-induced charge multiplication region in epitaxial silicon diodesWProperties of a radiati...preprint / 2010Challenges for Silicon Pixel Sensors at the European XFELWChallenges for Silicon ...preprint / 2012Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsWStudy of the accumulati...preprint / 2013Radiation Induced Point and Cluster-Related Defects with Strong Impact to Damage Properties of Silicon DetectorsWRadiation Induced Point...preprint / 2009
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Eckhart Fretwurst

Researcher