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Daniel Primetzhofer
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Daniel Primetzhofer12 visible / 12 total nodes / 11 links

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AuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipDaniel PrimetzhoferADaniel PrimetzhoferResearcherElectronic stopping power of hydrogen in a high-k material at the stopping maximum and belowWElectronic stopping pow...preprint / 2013Ultra-thin film and interface analysis of high-k dielectric materials employing Time-Of-Flight Medium Energy Ion Scattering (TOF-MEIS)WUltra-thin film and int...preprint / 2013The potential of Rutherford Backscattering Spectrometry for composition analysis of colloidal nanocrystalsWThe potential of Ruther...preprint / 2013Disparate energy scaling of trajectory-dependent electronic excitations for slow protons and He ionsWDisparate energy scalin...preprint / 2020Control of site occupancy by variation of the Zn and Al content in NiZnAl ferrite epitaxial films with low magnetic dampingWControl of site occupan...preprint / 2021Impact of the experimental approach on the observed electronic energy loss for light keV ions in thin self-supporting filmsWImpact of the experimen...preprint / 2020In-situ Nanoscale Characterization of Composition and Structure during Formation of Ultrathin Nickel SilicideWIn-situ Nanoscale Chara...preprint / 2020Assessing electron emission induced by pulsed ion beams: a time-of-flight approachWAssessing electron emis...preprint / 2020On the influence of uncertainties in scattering potentials on quantitative analysis using keV ionsWOn the influence of unc...preprint / 2019Electronic excitation of transition metal nitrides by light ions with keV energiesWElectronic excitation o...preprint / 2020Influence of structure and cation distribution on magnetic anisotropy and damping in Zn/Al doped nickel ferritesWInfluence of structure ...preprint / 2020
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Daniel Primetzhofer

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PaperElectronic stopping power of hydrogen in a high-k material at the stopping maximum and belowAuthorship / preprint / 2013PaperUltra-thin film and interface analysis of high-k dielectric materials employing Time-Of-Flight Medium Energy Ion Scattering (TOF-MEIS)Authorship / preprint / 2013PaperThe potential of Rutherford Backscattering Spectrometry for composition analysis of colloidal nanocrystalsAuthorship / preprint / 2013PaperDisparate energy scaling of trajectory-dependent electronic excitations for slow protons and He ionsAuthorship / preprint / 2020PaperControl of site occupancy by variation of the Zn and Al content in NiZnAl ferrite epitaxial films with low magnetic dampingAuthorship / preprint / 2021PaperImpact of the experimental approach on the observed electronic energy loss for light keV ions in thin self-supporting filmsAuthorship / preprint / 2020PaperIn-situ Nanoscale Characterization of Composition and Structure during Formation of Ultrathin Nickel SilicideAuthorship / preprint / 2020PaperAssessing electron emission induced by pulsed ion beams: a time-of-flight approachAuthorship / preprint / 2020

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