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C. Bongiorno
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AuthorshipAuthorshipAuthorshipAuthorshipC. BongiornoAC. BongiornoResearcherOn the origin of the premature breakdown of thermal oxide on 3C-SiC probed by electrical scanning probe microscopyWOn the origin of the pr...preprint / 2020Simulation of the growth kinetics in group IV compound semiconductorsWSimulation of the growt...preprint / 2020Impact of stacking faults and domain boundaries on the electronic transport in cubic silicon carbide probed by conductive atomic force microscopyWImpact of stacking faul...preprint / 2020Nanoscale insights on the origin of the Power MOSFETs breakdown after extremely long high temperature reverse bias stressWNanoscale insights on t...preprint / 2020
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C. Bongiorno

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PaperOn the origin of the premature breakdown of thermal oxide on 3C-SiC probed by electrical scanning probe microscopyAuthorship / preprint / 2020PaperSimulation of the growth kinetics in group IV compound semiconductorsAuthorship / preprint / 2020PaperImpact of stacking faults and domain boundaries on the electronic transport in cubic silicon carbide probed by conductive atomic force microscopyAuthorship / preprint / 2020PaperNanoscale insights on the origin of the Power MOSFETs breakdown after extremely long high temperature reverse bias stressAuthorship / preprint / 2020

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