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Yuzo Ohno

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3 publications

preprint2012arXiv

On the influence of nanometer-thin antiferromagnetic surface layer on ferromagnetic CrO2_2

We present magnetic stray field measurements performed on a single micro-crystal of the half metallic ferromagnet CrO2_2, covered by a naturally grown 2\,-\,5\,nm surface layer of antiferromagnetic (AFM) Cr2_2O3_3. The temperature variation of the stray field of the micro-crystal measured by micro-Hall magnetometry shows an anomalous increase below ∼\sim\,60\,K. We find clear evidence that this behavior is due to the influence of the AFM surface layer, which could not be isolated in the corresponding bulk magnetization data measured using SQUID magnetometry. The distribution of pinning potentials, analyzed from Barkhausen jumps, exhibits a similar temperature dependence. Overall, the results indicate that the surface layer plays a role in defining the potential landscape seen by the domain configuration in the ferromagnetic grain.

preprint2010arXiv

Band-tail shape and transport near the metal-insulator transition in Si-doped Al(0.3)Ga(0.7)As

In the present work, an infrared LED is used to photodope MBE-grown Si:Al(0.3)Ga(0.7)As, a well known persistent photoconductor, to vary the effective electron concentration of samples in situ. Using this technique, we examine the transport properties of two samples containing different nominal doping concentrations of Si (1x10^19 cm^-3 for sample 1 (S1) and 9x10^17 cm^-3 for sample 2 (S2)) and vary the effective electron density between 10^14 and 10^18 cm^-3. The metal-insulator transition (MIT) for S1 is found to occur at a critical carrier concentration of 5.7x10^16 cm^-3 at 350 mK. The mobilities in both samples are found to be limited by ionized impurity scattering in the temperature range probed, and are adequately described by the Brooks-Herring screening theory for higher carrier densities. The shape of the band-tail of the density of states (DOS) in Al(0.3)Ga(0.7)As is found electrically through transport measurements. It is determined to be exponential in character, with an exponent of -1.25 for S1 and -1.38 for S2.

preprint2010arXiv

Magnetization dynamics of a CrO2_2 grain studied by micro-Hall magnetometry

Micro-Hall magnetometry is employed to study the magnetization dynamics of a single, micron-size CrO2_2 grain. With this technique we track the motion of a single domain wall, which allows us to probe the distribution of imperfections throughout the material. An external magnetic field along the grain's easy magnetization direction induces magnetization reversal, giving rise to a series of sharp jumps in magnetization. Supported by micromagnetic simulations, we identify the transition to a state with a single cross-tie domain wall, where pinning/depinning of the wall results in stochastic Barkhausen jumps.

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