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Yunxiao He

Yunxiao He contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Measurements of the growth and saturation of electron Weibel instability in optical-field ionized plasmas

The temporal evolution of the magnetic field associated with electron thermal Weibel instability in optical-field ionized plasmas is measured using ultrashort (1.8 ps), relativistic (45 MeV) electron bunches from a linear accelerator. The self-generated magnetic fields are found to self-organize into a quasi-static structure consistent with a helicoid topology within a few ps and such a structure lasts for tens of ps in underdense plasmas. The measured growth rate agrees well with that predicted by the kinetic theory of plasmas taking into account collisions. Magnetic trapping is identified as the dominant saturation mechanism.

preprint2020arXiv

Region-of-interest micro-focus CT based on an all-optical inverse Compton scattering source

Micro-focus computed tomography (CT), enabling the reconstruction of hyperfine structure within objects, is a powerful nondestructive testing tool in many fields. Current X-ray sources for micro-focus CT are typically limited by their relatively low photon energy and low flux. An all-optical inverse Compton scattering source (AOCS) based on laser wakefield accelerator (LWFA) can generate intense quasi-monoenergetic X/gamma-ray pulses in the keV-MeV range with micron-level source size, and its potential application for micro-focus CT has become very attractive in recent years due to the fast pace progress made in LWFA. Here we report the first experimental demonstration of high-fidelity micro-focus CT using AOCS (~70 keV) by imaging and reconstructing a test object with complex inner structures. A region-of-interest (ROI) CT method is adopted to utilize the relatively small field-of-view (FOV) of AOCS to obtain high-resolution reconstruction. This demonstration of the ROI micro-focus CT based on AOCS is a key step for its application in the field of hyperfine nondestructive testing.