Researcher profile

Yuji Iwahori

Yuji Iwahori contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Coronavirus disease situation analysis and prediction using machine learning: a study on Bangladeshi population

During a pandemic, early prognostication of patient infected rates can reduce the death by ensuring treatment facility and proper resource allocation. In recent months, the number of death and infected rates has increased more distinguished than before in Bangladesh. The country is struggling to provide moderate medical treatment to many patients. This study distinguishes machine learning models and creates a prediction system to anticipate the infected and death rate for the coming days. Equipping a dataset with data from March 1, 2020, to August 10, 2021, a multi-layer perceptron (MLP) model was trained. The data was managed from a trusted government website and concocted manually for training purposes. Several test cases determine the model's accuracy and prediction capability. The comparison between specific models assumes that the MLP model has more reliable prediction capability than the support vector regression (SVR) and linear regression model. The model presents a report about the risky situation and impending coronavirus disease (COVID-19) attack. According to the prediction produced by the model, Bangladesh may suffer another COVID-19 attack, where the number of infected cases can be between 929 to 2443 and death cases between 19 to 57.

preprint2013arXiv

Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.