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Yishai Shperber

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Published work

5 published item(s)

preprint2016arXiv

Anisotropic transport at the LaAlO3/SrTiO3 interface explained by microscopic imaging of channel-flow over SrTiO3 domains

Oxide interfaces, including the LaAlO3/SrTiO3 interface, have been a subject of intense interest for over a decade due to their rich physics and potential as low dimensional nanoelectronic systems. The field has reached the stage where efforts are invested in developing devices. It is critical now to understand the functionalities and limitations of such devices. Recent scanning probe measurements of the LaAlO3/SrTiO3 interface have revealed locally enhanced current flow and accumulation of charge along channels related to SrTiO3 structural domains. These observations raised a key question regarding the role these modulations play in the macroscopic properties of devices. Here we show that the microscopic picture, mapped by scanning superconducting quantum interference device, accounts for a substantial part of the macroscopically measured transport anisotropy. We compared local flux data with transport values, measured simultaneously, over various SrTiO3 domain configurations. We show a clear relation between maps of local current density over specific domain configurations and the measured anisotropy for the same device. The domains divert the direction of current flow, resulting in a direction dependent resistance. We also show that the modulation can be significant and that in some cases up to 95% of the current is modulated over the channels. The orientation and distribution of the SrTiO3 structural domains change between different cooldowns of the same device or when electric fields are applied, affecting the device behavior. Our results, highlight the importance of substrate physics, and in particular, the role of structural domains, in controlling electronic properties of LaAlO3/SrTiO3 devices. Further, these results point to new research directions, exploiting the STO domains ability to divert or even carry current.

preprint2013arXiv

Thermally assisted current-induced magnetization reversal in SrRuO3

We inject a sequence of 1 ms current pulses into uniformly magnetized patterns of the itinerant ferromagnet SrRuO3 until a magnetization reversal is detected. We detect the effective temperature during the pulse and find that the cumulative pulse time required to induce magnetization reversal depends exponentially on 1/T. In addition, we find that the cumulative pulse time also depends exponentially on the current amplitude. These observations indicate current-induced magnetization reversal assisted by thermal fluctuations.

preprint2012arXiv

Current-induced magnetization reversal in SrRuO3

We inject current pulses into uniformly magnetized patterns of thin films of the itinerant ferromagnet SrRuO3, while monitoring the effective temperature of the patterns during the current injection. We gradually increase the amplitude of the pulses until magnetization reversal occurs. We observe magnetization reversal induced by current above a temperature-dependent threshold and show that this effect is not simply due to sample heating or Oersted fields. We discuss the applicability of the current-induced spin-wave instability scenario.

preprint2011arXiv

Scaling and field-induced crossover of the anomalous Hall effect in SrRuO3

We measure the anomalous Hall effect (AHE) resistivity $ρ_{xy}$ in thin films of the itinerant ferromagnet SrRuO$_{3}$. At low temperatures, the AHE coefficient $R_{s}$ varies with $ρ_{xx}^2$ in agreement with side jumps and Berry phase models. At higher temperatures, $R_{s}$ reaches a peak and then changes sign just below $T_{c}$. We find that for all films studied $R_{s}$ scales with resistivity in the entire ferromagnetic phase. SrRuO$_{3}$ films with very low residual resistivity exhibit field induced sign changes of the AHE at low temperatures, suggesting an $ω_c τ$ related crossover.

preprint2011arXiv

Scaling of the anomalous Hall effect in SrRuO$_{3}$

We measure the anomalous Hall effect (AHE) resistivity $ρ_{xy}$ in thin films of the itinerant ferromagnet SrRuO$_{3}$. At low temperatures, the AHE coefficient $R_{s}$ varies with $ρ_{xx}^2$, and at higher temperatures, $R_{s}$ reaches a peak and then changes sign just below $T_{c}$. We find that for all films studied $R_{s}$ scales with resistivity in the entire ferromagnetic phase. We attribute the observed behavior to the contribution of the extrinsic side jumps mechanism and the intrinsic Karplus-Luttinger (Berry phase) mechanism including the effect of finite scattering rates.