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Yessica Saez

Yessica Saez contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Cryptography and SecurityEmerging Technologies

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Published work

2 published item(s)

preprint2014arXiv

Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law-Johnson-noise secure key exchange

We classify and analyze bit errors in the current measurement mode of the Kirchhoff-law-Johnson-noise (KLJN) key distribution. The error probability decays exponentially with increasing bit exchange period and fixed bandwidth, which is similar to the error probability decay in the voltage measurement mode. We also analyze the combination of voltage and current modes for error removal. In this combination method, the error probability is still an exponential function that decays with the duration of the bit exchange period, but it has superior fidelity to the former schemes.

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preprint2013arXiv

Errors and their mitigation at the Kirchhoff-law-Johnson-noise secure key exchange

A method to quantify the error probability at the Kirchhoff-law-Johnson-noise (KLJN) secure key exchange is introduced. The types of errors due to statistical inaccuracies in noise voltage measurements are classified and the error probability is calculated. The most interesting finding is that the error probability decays exponentially with the duration of the time window of single bit exchange. The results indicate that it is feasible to have so small error probabilities of the exchanged bits that error correction algorithms are not required. The results are demonstrated with practical considerations.

0 citations0 reviewsNo code linkedOpen access