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Yaqian Zhang

Yaqian Zhang contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2026arXiv

Reducing The Sub-packetization Level of Optimal-Access Cooperative MSR Codes

Cooperative MSR codes are a kind of storage codes which enable optimal-bandwidth repair of any $h\geq2$ node erasures in a cooperative way, while retaining the minimum storage as an $[n,k]$ MDS code. Each code coordinate (node) is assumed to store an array of $\ell$ symbols, where $\ell$ is termed as sub-packetization. Large sub-packetization tends to induce high complexity, large input/output in practice. To address the disk IO capability, a cooperative MSR code is said to have optimal-access property, if during node repair, the amount of data accessed at each helper node meets a theoretical lower bound. In this paper, we focus on reducing the sub-packetization of optimal-access cooperative MSR codes with two erasures. At first, we design two crucial MDS array codes for repairing a specific repair pattern of two erasures with optimal access. Then, using the two codes as building blocks and by stacking up of the two codes for several times, we obtain an optimal-access cooperative MSR code with two erasures. The derived code has sub-packetization $\ell=r^{\binom{n}{2}-\lfloor\frac{n}{r}\rfloor(\binom{r}{2}-1)}$ where $r=n-k$, and it reduces $\ell$ by a fraction of $1/r^{\lfloor\frac{n}{r}\rfloor(\binom{r}{2}-1)}$ compared with the state of the art ($\ell=r^{\binom{n}{2}}$).

preprint2022arXiv

A non-invasive fault location method for modular multilevel converters under light load conditions

This paper proposes a non-invasive fault location method for modular multilevel converters (MMC) considering light load conditions. The prior-art fault location methods of the MMC are often developed and verified under full load conditions. However, it is revealed that the faulty arm current will be suppressed to be unipolar when the open-circuit fault happens on the submodule switch under light load. This leads to the capacitor voltage of the healthy and faulty submodules rising or falling with the same variations, increasing the difficulty of fault location. The proposed approach of injecting the second-order circulating current will rebuild the bipolar arm current of the MMC and enlarge the capacitor voltage deviations between the healthy and faulty SMs. As a result, the fault location time is significantly shortened. The simulations are carried out to validate the effectiveness of the proposed approach, showing that the fault location time is reduced to 1/6 compared with the condition without second-order circulating current injection.