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Y. Yokoyama

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Published work

3 published item(s)

preprint2015arXiv

Electronic structure of Li$_{1+x}$[Mn$_{0.5}$Ni$_{0.5}$]$_{1-x}$O$_2$ studied by photoemission and x-ray absorption spectroscopy

We have studied the electronic structure of Li$_{1+x}$[Mn$_{0.5}$Ni$_{0.5}$]$_{1-x}$O$_2$ ($x$ = 0.00 and 0.05), one of the promising cathode materials for Li ion battery, by means of x-ray photoemission and absorption spectroscopy. The results show that the valences of Mn and Ni are basically 4+ and 2+, respectively. However, the Mn$^{3+}$ component in the $x$ = 0.00 sample gradually increases with the bulk sensitivity of the experiment, indicating that the Jahn-Teller active Mn$^{3+}$ ions are introduced in the bulk due to the site exchange between Li and Ni. The Mn$^{3+}$ component gets negligibly small in the $x$ = 0.05 sample, which indicates that the excess Li suppresses the site exchange and removes the Jahn-Teller active Mn$^{3+}$.

preprint2014arXiv

A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging

The determination of the contact area is a key step to derive mechanical properties such as hardness or an elastic modulus by instrumented indentation testing. Two families of procedures are dedicated to extracting this area: on the one hand, post mortem measurements that require residual imprint imaging, and on the other hand, direct methods that only rely on the load vs. the penetration depth curve. With the development of built-in scanning probe microscopy imaging capabilities such as atomic force microscopy and indentation tip scanning probe microscopy, last generation indentation devices have made systematic residual imprint imaging much faster and more reliable. In this paper, a new post mortem method is introduced and further compared to three existing classical direct methods by means of a numerical and experimental benchmark covering a large range of materials. It is shown that the new method systematically leads to lower error levels regardless of the type of material. Pros and cons of the new method vs. direct methods are also discussed, demonstrating its efficiency in easily extracting mechanical properties with an enhanced confidence.

preprint2006arXiv

Monte-Carlo Simulator and Ancillary Response Generator of Suzaku XRT/XIS System for Spatially Extended Source Analysis

We have developed a framework for the Monte-Carlo simulation of the X-Ray Telescopes (XRT) and the X-ray Imaging Spectrometers (XIS) onboard Suzaku, mainly for the scientific analysis of spatially and spectroscopically complex celestial sources. A photon-by-photon instrumental simulator is built on the ANL platform, which has been successfully used in ASCA data analysis. The simulator has a modular structure, in which the XRT simulation is based on a ray-tracing library, while the XIS simulation utilizes a spectral "Redistribution Matrix File" (RMF), generated separately by other tools. Instrumental characteristics and calibration results, e.g., XRT geometry, reflectivity, mutual alignments, thermal shield transmission, build-up of the contamination on the XIS optical blocking filters (OBF), are incorporated as completely as possible. Most of this information is available in the form of the FITS (Flexible Image Transport System) files in the standard calibration database (CALDB). This simulator can also be utilized to generate an "Ancillary Response File" (ARF), which describes the XRT response and the amount of OBF contamination. The ARF is dependent on the spatial distribution of the celestial target and the photon accumulation region on the detector, as well as observing conditions such as the observation date and satellite attitude. We describe principles of the simulator and the ARF generator, and demonstrate their performance in comparison with in-flight data.