Researcher profile

W. J. Engelen

W. J. Engelen contributes to research discovery and scholarly infrastructure.

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Published work

4 published item(s)

preprint2014arXiv

Analytical Model of an Isolated Single-atom Electron Source

An analytical model of a single-atom electron source is presented, where electrons are created by near-threshold photoionization of an isolated atom. The model considers the classical dynamics of the electron just after the photon absorption, i.e. its motion in the potential of a singly charged ion and a uniform electric field used for acceleration. From closed expressions for the asymptotic transverse electron velocities and trajectories, the effective source temperature and the effective source size can be calculated. The influence of the acceleration field strength and the ionization laser energy on these properties has been studied. With this model, a single-atom electron source with the optimum electron beam properties can be designed. Furthermore, we show that the model is also applicable to ionization of rubidium atoms, thus also describes the ultracold electron source, which is based on photoionization of laser-cooled alkali atoms.

preprint2014arXiv

Ultrafast electron diffraction using an ultracold source

We present diffraction patterns from micron-sized areas of mono-crystalline graphite obtained with an ultracold and ultrafast electron source. We show that high spatial coherence is manifest in the visibility of the patterns even for picosecond bunches of appreciable charge, enabled by the extremely low source temperature (~ 10 K). For a larger, ~ 100 um spot size on the sample, spatial coherence lengths > 10 nm result, sufficient to resolve diffraction patterns of complex protein crystals. This makes the source ideal for ultrafast electron diffraction of complex macromolecular structures such as membrane proteins, in a regime unattainable by conventional photocathode sources. By further reducing the source size, sub-um spot sizes on the sample become possible with spatial coherence lengths exceeding 1 nm, enabling ultrafast nano-diffraction for material science.

preprint2013arXiv

Polarization effects on the effective temperature of an ultracold electron source

The influence has been studied of the ionization laser polarization on the effective temperature of an ultracold electron source, which is based on near-threshold photoionization. This source is capable of producing both high-intensity and high-coherence electron pulses, with applications in for example electron diffraction experiments. For both nanosecond and femtosecond photoionization, a sinusoidal dependence of the temperature on polarization angle has been found. For most experimental conditions, the temperature is minimal when the polarization coincides with the direction of acceleration. However, surprisingly, for nanosecond ionization a regime exists when the temperature is minimal when the polarization is perpendicular to the acceleration direction. This shows that in order to create electron bunches with the highest transverse coherence length, it is important to control the polarization of the ionization laser. The general trends and magnitudes of the temperature measurements are described by a model, based on the analysis of classical electron trajectories; this model further deepens our understanding of the internal mechanisms during the photoionization process. Furthermore, for nanosecond ionization, charge oscillations as a function of laser polarization have been observed; for most situations the oscillation amplitude is small.

preprint2011arXiv

Measurement of the temperature of an ultracold ion source using time-dependent electric fields

We report on a measurement of the characteristic temperature of an ultracold rubidium ion source, in which a cloud of laser-cooled atoms is converted to ions by photo-ionization. Extracted ion pulses are focused on a detector with a pulsed-field technique. The resulting experimental spot sizes are compared to particle-tracking simulations, from which a source temperature $T = (1 \pm 2)$ mK and the corresponding transversal reduced emittance $ε_r = 7.9 X 10^{-9}$ m rad $\sqrt{\rm{eV}}$ are determined. We find that this result is likely limited by space charge forces even though the average number of ions per bunch is 0.022.