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Viswanath Balakrishnan

Viswanath Balakrishnan appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2019arXiv

Thermal Expansion Coefficient and Phonon Dynamics in Coexisting Allotropes of Monolayer WS2 Probed by Raman Scattering

We report a comprehensive temperature dependent Raman measurements on three different phases of monolayer WS2 from 4K to 330K in a wide spectral range. Our studies revels the anomalous nature of the first as well as the higher order combination modes reflected in the disappearance of the few modes and anomalous temperature evaluation of the phonon self-energy parameters attributed to the detuning of resonance condition and development of strain due to thermal expansion mismatch with the underlying substrate. Our detailed temperature dependence studies also decipher the ambiguity about assignment of the two modes in literature near ~ 297 cm-1 and 325 cm-1. Mode near 297 cm-1 is assigned as first order Raman mode, which is forbidden in the backscattering geometry and 325 cm-1 is assigned to the combination of and mode. We also estimated thermal expansion coefficient by systematically disentangling the substrate effect in the temperature range of 4K to 330K and probed its temperature dependence in 1H, 1T and 1T' phases.

preprint2013arXiv

Direct in-situ observation of structural transition driven actuation in VO2 utilizing electron transparent cantilevers

Direct imaging and quantification of actuation in nanostructures that undergo structural phase transitions could advance our understanding of collective phenomena in the solid state. Here, we demonstrate visualization of structural phase transition induced actuation in a model correlated insulator vanadium dioxide by in-situ Fresnel contrast imaging of electron transparent cantilevers. We quantify abrupt, reversible cantilever motion occurring due to the stress relaxation across the structural transition from monoclinic to tetragonal phase with increasing temperature. Deflections measured in such nanoscale cantilevers can be directly correlated with macroscopic stress measurements by wafer curvature studies as well as temperature dependent electrical conduction allowing one to interrogate lattice dynamics across length scales.