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Vincent P. A. Lonij

Vincent P. A. Lonij appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.atom-ph

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Published work

2 published item(s)

preprint2010arXiv

Absolute and ratio measurements of the polarizability of Na, K, and Rb with an atom interferometer

We measured the ground state electric dipole polarizability of sodium, potassium, and rubidium using a Mach-Zehnder atom interferometer with an electric field gradient. We find alpha_Na=24.11(2)_stat(18)_sys x 10^-24 cm^3, alpha_K=43.06(14)(33), and alpha_Rb=47.24(12)(42). Since these measurements were all performed in the same apparatus and subject to the same systematic errors we can present polarizability ratios with 0.3% precision. We find alpha_Rb/alpha_Na=1.959(5), alpha_K/alpha_Na=1.786(6), and alpha_Rb/alpha_K=1.097(5). We combine our ratio measurements with the higher precision measurement of sodium polarizability by Ekstrom et al. [Phys. Rev. A 51, 3883 (1995)] to find alpha_K=43.06(21) and alpha_Rb=47.24(21).

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preprint2010arXiv

Magic ratio of window width to grating period for Van der Waals potential measurements using material gratings

We report improved precision measurements of the Van der Waals potential strength ($C_3$) for Na atoms and a silicon-nitride (SiN$_x$) surface. We studied diffraction from nano-fabricated gratings with a particular "magic" open-fraction that allows us to determine $C_3$ without the need for separate measurements of the width of the grating openings. Therefore, finding the magic open-fraction improves the precision of $C_3$ measurements. The same effect is demonstrated for a grating with an arbitrary open-fraction by rotating it to a particular "magic" angle, yielding $C_3=3.42\pm 0.19 \textrm{eV} \mathring{\textrm{A}}^3$ for Na and a SiN$_x$ surface. This precision is sufficient to detect a change in $C_3$ due to a thin metal coating on the grating surface. We discuss the contribution to $C_3$ of core electrons and edge effects.

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