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Vijayakumar Anand

Vijayakumar Anand contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2022arXiv

Bessel Speckles

Speckle patterns are formed by random interferences of mutually coherent beams. While speckles are often considered as an unwanted noise in many areas, they also formed the foundation for the development of numerous speckle-based imaging, holography and sensing technologies. In the recent years, artificial speckle patterns have been generated with spatially incoherent sources using static and dynamic optical modulators for advanced imaging applications. In this report, a fundamental study has been carried out with Bessel distribution as the fundamental building block of the speckle pattern: speckle patterns formed by randomly interfering Bessel beams. Indirect computational imaging framework has been applied to study the imaging characteristics. In general, Bessel beams have a long focal depth, which in this scenario is counteracted by the increase in randomness enabling tunability of the axial resolution between the limits of Bessel beam and a Gaussian beam. Three-dimensional computational imaging has been synthetically demonstrated. The presented study will lead to a new generation of incoherent imaging technologies.

preprint2020arXiv

Compact Three-Dimensional Quantitative Phase Contrast Imager

Detection of phase variations across optically transparent samples is often a difficult task. We propose and demonstrate a compact, lightweight and low cost quantitative phase contrast imager. Light diffracted from a pinhole is incident on a thick object and the modulated light is collected by an image sensor and the intensity pattern is recorded. Two optical configurations namely lens-based and lensless cases are compared. A modified phase-retrieval algorithm is implemented to extract the phase information of the sample at different axial planes from a single camera shot.

preprint2020arXiv

Tilted black-Si: ~0.45 form-birefringence from sub-wavelength needles

The self-organised conical needles produced by plasma etching of silicon (Si), known as black silicon (b-Si), create a form-birefringent surface texture when etching of Si orientated at angles of $θ_i < 50 - 70^\circ$ (angle between the Si surface and vertical plasma E-field). The height of the needles in the form-birefringent region following 15~min etching was $d\sim 200$ nm and had a 100 $μ$m width of the optical retardance/birefringence, characterised using polariscopy. The height of the b-Si needles corresponds closely to the skin-depth of Si $\simλ/4$ for the visible spectral range. Reflection-type polariscope with a voltage-controlled liquid-crystal retarder is proposed to directly measure the retardance $Δn\times d/λ\approx 0.15$ of the region with tilted b-Si needles. The quantified form birefringence of $Δn = - 0.45$ over $λ= 400-700$~nm spectral window was obtained. Such high values of $Δn$ at visible wavelengths can only be observed in the most birefringence calcite or barium borate as well as in liquid crystals. The replication of b-Si into Ni-shim with high fidelity was also demonstrated and can be used for imprinting of the b-Si nanopattern into other materials.