Researcher profile

V. B. Svetovoy

V. B. Svetovoy contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 21 - Emerging
8works
0followers
5topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

8 published item(s)

preprint2020arXiv

A way to measure the dispersion forces near the van der Waals-Casimir transition

Forces induced by quantum fluctuations of electromagnetic field control adhesion phenomena between rough solids when the bodies are separated by distances ~10nm. However, this distance range remains largely unexplored experimentally in contrast with the shorter (van der Waals forces) or the longer (Casimir forces) separations. The reason for this is the pull-in instability of the systems with the elastic suspension that poses a formidable limitation. In this paper we propose a genuine experimental configuration that does not suffer from the short distance instability. The method is based on adhered cantilever, whose shape is sensitive to the forces acting near the adhered end. The general principle of the method, its possible realization and feasibility are extensively discussed. The dimensions of the cantilever are determined by the maximum sensitivity to the forces. If the adhesion is defined by strong capillary or chemical interactions, the method loses its sensitivity. Special discussion is presented for the determination of the minimum distance between the rough solids upon contact, and for the compensation of the residual electrostatic contribution. The proposed method can be applied to any kind of solids (metals, semiconductors, dielectrics) and to any intervening medium (gas or liquid).

preprint2019arXiv

Comparison of Casimir forces and electrostatics from conductive SiC-Si/C and Ru surfaces

Comprehensive knowledge of Casimir forces and associated electrostatics from conductive SiC and Ru surfaces can be essential in diverse areas ranging from micro/nanodevice operation in harsh environments to multilayer coatings in advanced lithography technologies. Hence, the Casimir force was measured between an Au-coated microsphere and N-doped SiC samples with Si- and C-terminated faces, and the results were compared with the measurements using the same microsphere and a metallic Ruthenium surface. Electrostatic calibration showed that the Si- and C-faces behave differently with a nearly ~0.6-0.7 V difference in the contact potentials V0Si/C. We attribute this to a higher incorporation of N on the C-terminated face in the near surface region resulting in the formation of NOx and an increased work function compared to the Si-terminated surface which is in agreement with x-ray photoelectron spectroscopy data. Notably, the contact potential of the SiC-C face was closer to the metallic Ru-Au system. However, the measured optical properties of the SiC-Si/C terminated surfaces with ellipsometry did not show any substantial differences indicating that the effective depth of the Si/C terminating surface layers are significantly smaller than the photon penetration depth not leading to any differences in the calculated forces via Lifshitz theory. Nonetheless, the measured Casimir forces, after compensation of the electrostatics contributions, showed differences between the Si/C faces, whereas the comparison with the Lifshitz theory prediction shows better agreement for the SiC-Si face. Finally, comparison of the Casimir forces below 40 nm separations between the SiC-Si/C and Ru surfaces indicated that the short-range roughness effects on the Casimir force increase in magnitude with increasing metallic behavior of the plate surface.

preprint2014arXiv

Graphene-on-silicon near-field thermophotovoltaic cell

A graphene layer on top of a dielectric can dramatically influence ability of the material to radiative heat transfer. This property of graphene is used to improve the performance and reduce costs of near-field thermophotovoltaic cells. Instead of low bandgap semiconductors it is proposed to use graphene-on-silicon Schottky photovoltaic cells. One layer of graphene absorbs around 90% of incoming radiation and increases the heat transfer. This is due to excitation of plasmons in graphene, which are automatically tuned in resonance with the emitted light in the mid infrared range. The absorbed radiation excites electron-hole pairs in graphene, which are separated by the surface field induced by the Schottky barrier. For a quasi-monochromatic source the generated power is one order of magnitude larger and efficiency is on the same level as for semiconductor photovoltaic cells.

preprint2012arXiv

Plasmons enhance near-field radiative heat transfer for graphene-covered dielectrics

It is shown that a graphene layer on top of a dielectric slab can dramatically influence the ability of this dielectric for radiative heat exchange. Effect of graphene is related to thermally excited plasmons. Frequency of these resonances lies in the terahertz region and can be tuned by varying the Fermi level through doping or gating. Heat transfer between two dielectrics covered with graphene can be larger than that between best known materials and even much larger at low temperatures. Moreover, high heat transfer can be significantly modulated by electrical means that opens up new possibilities for very fast manipulations with the heat flux.

preprint2011arXiv

Characterization of optical properties and surface roughness profiles: The Casimir force between real materials

The Lifshitz theory provides a method to calculate the Casimir force between two flat plates if the frequency dependent dielectric function of the plates is known. In reality any plate is rough and its optical properties are known only to some degree. For high precision experiments the plates must be carefully characterized otherwise the experimental result cannot be compared with the theory or with other experiments. In this chapter we explain why optical properties of interacting materials are important for the Casimir force, how they can be measured, and how one can calculate the force using these properties. The surface roughness can be characterized, for example, with the atomic force microscope images. We introduce the main characteristics of a rough surface that can be extracted from these images, and explain how one can use them to calculate the roughness correction to the force. At small separations this correction becomes large as our experiments show. Finally we discuss the distance upon contact separating two rough surfaces, and explain the importance of this parameter for determination of the absolute separation between bodies.}

preprint2009arXiv

Influence of water adsorbed on gold on van der Waals/Casimir forces

In this paper we investigate the influence of ultra thin water layer (1-1.5 nm) on the van der Waals/Casimir force between gold surfaces. Adsorbed water is inevitably present on gold surfaces at ambient conditions as jump-up-to contact during adhesion experiments demonstrate. Calculations based on the Lifshitz theory give very good agreement with the experiment in absence of any water layer for surface separations d>10 nm. However, a layer of thickness h<1.5 nm is allowed by the error margin in force measurements. At shorter separations, d<10 nm, the water layer can have a strong influence as calculations show for flat surfaces. Nonetheless, in reality the influence of surface roughness must also be considered, and it can overshadow any water layer influence at separations comparable to the total sphere-plate rms roughness w_{shp}+w.

preprint2009arXiv

The distance upon contact: Determination from roughness profile

The point at which two random rough surfaces make contact takes place at the contact of the highest asperities. The distance upon contact d_0 in the limit of zero load has crucial importance for determination of dispersive forces. Using gold films as an example we demonstrate that for two parallel plates d_0 is a function of the nominal size of the contact area L and give a simple expression for d_0(L) via the surface roughness characteristics. In the case of a sphere of fixed radius R and a plate the scale dependence manifests itself as an additional uncertainty δd(L) in the separation, where the scale L is related with the separation d via the effective area of interaction L^2\simπRd. This uncertainty depends on the roughness of interacting bodies and disappears in the limit L\to \infty.

preprint2000arXiv

Do the precise measurements of the Casimir force agree with the expectations?

An upper limit on the Casimir force is found using the dielectric functions of perfect crystalline materials which depend only on well defined material constants. The force measured with the atomic force microscope is larger than this limit at small separations between bodies and the discrepancy is significant. The simplest modification of the experiment is proposed allowing to make its results more reliable and answer the question if the discrepancy has any relation with the existence of a new force.