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Tsubasa Tamba

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Published work

3 published item(s)

preprint2021arXiv

Simulation-based spectral analysis of X-ray CCD data affected by photon pile-up

We have developed a simulation-based method of spectral analysis for pile-up affected data of X-ray CCDs without any loss of photon statistics. As effects of the photon pile-up appear as complicated nonlinear detector responses, we employ a detailed simulation to calculate the important processes in an X-ray observation including physical interactions, detector signal generation, detector readout, and a series of data reduction processes. This simulation naturally reproduces X-ray-like and background-like events as results of X-ray photon merging in a single pixel or in a chunk of adjacent pixels, allowing us to construct a nonlinear spectral analysis framework that can treat pile-up affected observation data. For validation, we have performed data analysis of Suzaku XIS observations by using this framework with various parameters of the detector simulation all of which are optimized for that instrument. We present three cases of different pile-up degrees: PKS~2155-304 (negligible pile-up), Aquila~X-1 (moderate pile-up), and the Crab Nebula (strong pile-up); we show that the nonlinear analysis method produces results consistent with a conventional linear analysis for the negligible pile-up condition, and accurately corrects well-known pile-up effects such as spectral hardening and flux decrease for the pile-up cases. These corrected results are consistent with those obtained by a widely used core-exclusion method or by other observatories with much higher timing resolutions (without pile-up). Our framework is applicable to any types of CCDs used for X-ray astronomy including a future mission such as XRISM by appropriate optimization of the simulation parameters.

preprint2020arXiv

Artifact-less Coded Aperture Imaging in the X-ray Band with Multiple Different Random Patterns

The coded aperture imaging technique is a useful method of X-ray imaging in observational astrophysics. However, the presence of imaging noise or so-called artifacts in a decoded image is a drawback of this method. We propose a new coded aperture imaging method using multiple different random patterns for significantly reducing the image artifacts. This aperture mask contains multiple different patterns each of which generates a different artifact distribution in its decoded image. By summing all decoded images of the different patterns, the artifact distributions are cancelled out, and we obtain a remarkably accurate image. We demonstrate this concept with imaging experiments of a monochromatic 16 keV hard X-ray beam at the synchrotron photon facility SPring-8, using the combination of a CMOS image sensor and an aperture mask that has four different random patterns composed of holes with a diameter of 27 um and a separation of 39 um. The entire imaging system is installed in a 25 cm-long compact size, and achieves an angular resolution of < 30'' (full width at half maximum). In addition, we show by Monte Carlo simulation that the artifacts can be reduced more effectively if the number of different patterns increases to 8 or 16.

preprint2020arXiv

Development of the detector simulation framework for the Wideband Hybrid X-ray Imager onboard FORCE

FORCE is a Japan-US space-based astronomy mission for an X-ray imaging spectroscopy in an energy range of 1--80 keV. The Wideband Hybrid X-ray Imager (WHXI), which is the main focal plane detector, will use a hybrid semiconductor imager stack composed of silicon and cadmium telluride (CdTe). The silicon imager will be a certain type of the silicon-on-insulator (SOI) pixel sensor, named the X-ray pixel (XRPIX) series. Since the sensor has a small pixel size (30--36 $μ$m) and a thick sensitive region (300--500 $μ$m), understanding the detector response is not trivial and is important in order to optimize the camera design and to evaluate the scientific capabilities. We have developed a framework to simulate observations of celestial sources with semiconductor sensors. Our simulation framework was tested and validated by comparing our simulation results to laboratory measurements using the XRPIX 6H sensor. The simulator well reproduced the measurement results with reasonable physical parameters of the sensor including an electric field structure, a Coulomb repulsion effect on the carrier diffusion, and arrangement of the degraded regions. This framework is also applicable to future XRPIX updates including the one which will be part of the WHXI, as well as various types of semiconductor sensors.