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Triloki

Triloki appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.ins-detcond-mat.mtrl-sci

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Published work

4 published item(s)

preprint2015arXiv

Effect of humid air exposure on photoemissive and structural properties of KBr thin film photocathode

We have investigated the influence of water molecule absorption on photoemissive and structural properties of potassium bromide (KBr) thin film photocathode under humid air exposure at relative humidity (RH) 65%. It is evident from photoemission measurement that the photoelectron yield of KBr photocathode is degraded exponentially with humid air exposed time. Structural studies of the "as-deposited" and "humid air aged" films reveal that there is no effect of RH on film's crystalline face centered cubic (fcc) structure. However, the average crystallite size of "humid air exposed film" KBr film has been increased as compared to "as-deposited". In addition, topographical properties of KBr film are also examined by means of scanning electron microscope (SEM), transmission electron microscope (TEM) and atomic force microscope (AFM) and it is observed that granular characteristic of film has been altered, even for short exposure to humid air.

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preprint2015arXiv

Optical and structural properties of CsI thin film photocathode

In the present work performance of cesium iodide thin film photocathode is studied in detail. The optical absorbance of cesium iodide thin films have been analyzed in the spectral range of 190 nm to 900 nm. The optical band gap energy of 500 nm thick cesium iodide film is calculated using Tauc plot from absorbance data. Refractive index is estimated from envelope plot of transmittance data using Swanepoel's method. Absolute quantum efficiency measurement has been carried out in the wavelength range of 150 nm to 200 nm. Crystallographic nature and surface morphology are investigated by X-ray diffraction, transmission electron microscopy and atomic force microscopy techniques. In addition, elemental composition result gained by energy dispersive X-ray analysis is also reported in the present work.

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preprint2015arXiv

Photoemission and optical constant measurements of Cesium Iodide thin film photocathode

The performance of cesium iodide as a reflective photocathode is presented. The absolute quantum efficiency of a 500 nm thick film of cesium iodide has been measured in the wavelength range 150 nm to 200 nm. The optical absorbance has been analyzed in the wavelength range 190 nm to 900 nm and the optical band gap energy has been calculated. The dispersion properties were determined from the refractive index using an envelope plot of the transmittance data. The morphological and elemental film composition have been investigated by atomic force microscopy and X-ray photo-electron spectroscopy techniques.

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preprint2013arXiv

Structural characterization of as-deposited cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques

In the present work, cesium iodide (CsI) thin films of different thickness have been prepared by thermal evaporation technique. The crystallite size and grain size of these films are compared by using X-ray diffraction (XRD) profile analysis as well as by transmission electron microscopy (TEM) counting, respectively. These two methods provide less deviation between crystallite size and grain size in the case of thin CsI films of 4 nm, but there is comparatively large difference in case of thicker CsI films (20 nm, 100 nm and 500 nm). It indicates that dislocations are arranged in a configuration which causes small orientational difference between two adjacent coherent regions. The size obtained from XRD corresponds to two separate regions, whereas in the TEM micrograph the two regions may seem to correspond one region particularly in case of thicker films. Other physical parameters such as strain, stress and deformation energy density are also estimated precisely for the prominent XRD peaks of thicker CsI films in the range $2θ= 20^{0}-80^{0}$ by using a modified Williamson-Hall (W-H) analysis assuming uniform deformation model (UDM), uniform deformation stress model (UDSM) and uniform deformation energy density model (UDEDM).

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