Researcher profile

Tresa M. Pollock

Tresa M. Pollock contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

3DMaterialGAN: Learning 3D Shape Representation from Latent Space for Materials Science Applications

In the field of computer vision, unsupervised learning for 2D object generation has advanced rapidly in the past few years. However, 3D object generation has not garnered the same attention or success as its predecessor. To facilitate novel progress at the intersection of computer vision and materials science, we propose a 3DMaterialGAN network that is capable of recognizing and synthesizing individual grains whose morphology conforms to a given 3D polycrystalline material microstructure. This Generative Adversarial Network (GAN) architecture yields complex 3D objects from probabilistic latent space vectors with no additional information from 2D rendered images. We show that this method performs comparably or better than state-of-the-art on benchmark annotated 3D datasets, while also being able to distinguish and generate objects that are not easily annotated, such as grain morphologies. The value of our algorithm is demonstrated with analysis on experimental real-world data, namely generating 3D grain structures found in a commercially relevant wrought titanium alloy, which were validated through statistical shape comparison. This framework lays the foundation for the recognition and synthesis of polycrystalline material microstructures, which are used in additive manufacturing, aerospace, and structural design applications.

preprint2020arXiv

Electron Backscattered Diffraction using a New Monolithic Direct Detector: High Resolution and Fast Acquisition

A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection efficiency of the detector and its large array of pixels allow sensitive and accurate detection of Kikuchi bands arising from primary electron beam excitation energies of 4 keV to 28 keV, with the optimal contrast occurring in the range of 8-16 keV. The diffraction pattern acquisition speed is substantially improved via a sparse sampling mode, resulting from the acquisition of a reduced number of pixels on the detector. Standard inpainting algorithms are implemented to effectively estimate the information in the skipped regions in the acquired diffraction pattern. For EBSD mapping, a speed as high as 5988 scan points per second is demonstrated, with a tolerable fraction of indexed points and accuracy. The collective capabilities spanning from high angular resolution EBSD pattern to high speed pattern acquisition are achieved on the same detector, facilitating simultaneous detection modalities that enable a multitude of advanced EBSD applications, including lattice strain mapping, structural refinement, low-dose characterization, 3D-EBSD and dynamic in situ EBSD.