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Toshimitsu Aritake

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Published work

3 published item(s)

preprint2026arXiv

Integrating Bayesian Spectral Deconvolution and Expert Scientific Reasoning for Robust Peak Estimation

Spectral deconvolution is essential for extracting peak structures that encode material properties and chemical structures, but conventional automated methods often fail when spectra contain high-intensity noise or unknown background components. In practice, scientists rarely interpret spectra in isolation. Instead, they identify physically meaningful peaks by relating spectral structures to auxiliary information such as physical-property values, chemical structures, and trends across related measurements. Here, we propose a Bayesian framework that integrates spectral deconvolution with a model of expert scientific reasoning. In this work, expert scientific reasoning refers to the practice of evaluating candidate spectral structures by their consistency with independently measured physical-property values, rather than to manual expert intervention during inference. We formalize this reasoning as a physical-property regression layer, implemented using Gaussian process regression, and couple it with Bayesian spectral deconvolution. By averaging the physical-property likelihood over posterior predictive spectra inferred from Bayesian spectral deconvolution, the proposed method selects spectral models according to the consistency between inferred spectral structures and physical-property information. We validate the framework using synthetic spectra with high-intensity noise or unknown backgrounds and infrared spectra of poly(lactic acid). The method recovers physically meaningful peak structures that conventional Bayesian spectral deconvolution misses or misidentifies from spectra alone, including weak peaks in poly(lactic acid) IR spectra related to measured degradation rates. These results demonstrate that integrating expert scientific reasoning with Bayesian spectral deconvolution enables robust peak estimation under conditions where spectrum-only inference is unreliable.

preprint2022arXiv

Unsupervised Domain Adaptation for Extra Features in the Target Domain Using Optimal Transport

Domain adaptation aims to transfer knowledge of labeled instances obtained from a source domain to a target domain to fill the gap between the domains. Most domain adaptation methods assume that the source and target domains have the same dimensionality. Methods that are applicable when the number of features is different in each domain have rarely been studied, especially when no label information is given for the test data obtained from the target domain. In this paper, it is assumed that common features exist in both domains and that extra (new additional) features are observed in the target domain; hence, the dimensionality of the target domain is higher than that of the source domain. To leverage the homogeneity of the common features, the adaptation between these source and target domains is formulated as an optimal transport (OT) problem. In addition, a learning bound in the target domain for the proposed OT-based method is derived. The proposed algorithm is validated using both simulated and real-world data.

preprint2020arXiv

Fast and robust multiplane single molecule localization microscopy using deep neural network

Single molecule localization microscopy is widely used in biological research for measuring the nanostructures of samples smaller than the diffraction limit. This study uses multifocal plane microscopy and addresses the 3D single molecule localization problem, where lateral and axial locations of molecules are estimated. However, when we multifocal plane microscopy is used, the estimation accuracy of 3D localization is easily deteriorated by the small lateral drifts of camera positions. We formulate a 3D molecule localization problem along with the estimation of the lateral drifts as a compressed sensing problem, A deep neural network was applied to accurately and efficiently solve this problem. The proposed method is robust to the lateral drifts and achieves an accuracy of 20 nm laterally and 50 nm axially without an explicit drift correction.