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Tobias Jungk

Tobias Jungk contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2010arXiv

Electrostatic topology of ferroelectric domains in YMnO$_3$

Trimerization-polarization domains in ferroelectric hexagonal YMnO$_3$ were resolved in all three spatial dimensions by piezoresponse force microscopy. Their topology is dominated by electrostatic effects with a range of 100 unit cells and reflects the unusual electrostatic origin of the spontaneous polarization. The response of the domains to locally applied electric fields explains difficulties in transferring YMnO$_3$ into a single-domain state. Our results demonstrate that the wealth of non-displacive mechanisms driving ferroelectricity that emerged from the research on multiferroics are a rich source of alternative types of domains and domain-switching phenomena.

preprint2010arXiv

Lateral Signals in Piezoresponse Force Microscopy at Domain Boundaries of Ferroelectric Crystals

In piezoresponse force microscopy a lateral signal at the domain boundaries is occasionally observed. In recent years, a couple of experiments have been reported and varying explanations for the origin of this lateral signal have been proposed. Additionally, elaborated theoretical modeling for this particular issue has been carried out. Here we present experimental data obtained on different crystallographic cuts of $\rm LiNbO_3$, $\rm BaTiO_3$, and $\rm KTiOPO_4$ single crystals. We could thereby rule out some of the explanations proposed so far, introduce another possible mechanism, and quantitatively compare our results to the existing modeling.

preprint2009arXiv

Depth Resolution of Piezoresponse Force Microscopy

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.