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Thomas Tybell

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cond-mat.mtrl-sci cond-mat.mes-hall

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preprint2022arXiv

Low-energy Properties of Electrons and Holes in CuFeS$_2$

The antiferromagnetic semiconductor CuFeS$_2$ belongs to a magnetic symmetry class that is of interest for spintronics applications. In addition, its crystal lattice is compatible with Si, making it possible to integrate it with non-magnetic semiconducting structures. Therefore, we investigate this material by finding the effective $\boldsymbol{k}\cdot\boldsymbol{p}$ Hamiltonian for the electron- and hole bands. We base this description on \textit{ab initio} calculations and classify the electronic bands by their symmetry. As a result, we find that CuFeS$_2$ exhibits spin-polarized bands and an anomalous Hall effect. Finally, we suggest using cyclotron resonance to verify our proposed effective mass tensors at the conduction band minimum and valence band maximum.

preprint2016arXiv

Assessing electron beam sensitivity for SrTiO$_3$ and La$_{0.7}$Sr$_{0.3}$MnO$_3$ using electron energy loss spectroscopy

Thresholds for beam damage have been assessed for La$_{0.7}$Sr$_{0.3}$MnO$_3$ and SrTiO$_3$ as a function of electron probe current and exposure time at 80 and 200 kV acceleration voltage. The materials were exposed to an intense electron probe by aberration corrected scanning transmission electron microscopy (STEM) with simultaneous acquisition of electron energy loss spectroscopy (EELS) data. Electron beam damage was identified by changes of the core loss fine structure after quantification by a refined and improved model based approach. At 200 kV acceleration voltage, damage in SrTiO$_3$ was identified by changes both in the EEL fine structure and by contrast changes in the STEM images. However, the changes in the STEM image contrast as introduced by minor damage can be difficult to detect under several common experimental conditions. No damage was observed in SrTiO$_3$ at 80 kV acceleration voltage, independent of probe current and exposure time. In La$_{0.7}$Sr$_{0.3}$MnO$_3$, beam damage was observed at both 80 and 200 kV acceleration voltages. This damage was observed by large changes in the EEL fine structure, but not by any detectable changes in the STEM images. The typical method to validate if damage has been introduced during acquisitions is to compare STEM images prior to and after spectroscopy. Quantifications in this work show that this method possibly can result in misinterpretation of beam damage as changes of material properties.

preprint2016arXiv

Thickness and temperature dependence of the magnetodynamic damping of pulsed laser deposited $\text{La}_{0.7}\text{Sr}_{0.3}\text{MnO}_3$ on (111)-oriented SrTi$\text{O}_3$

We have investigated the magnetodynamic properties of $\text{La}_{0.7}\text{Sr}_{0.3}\text{MnO}_3$ (LSMO) films of thickness 10, 15 and 30 nm grown on (111)-oriented SrTi$\text{O}_3$ (STO) substrates by pulsed laser deposition. Ferromagnetic resonance (FMR) experiments were performed in the temperature range 100--300 K, and the magnetodynamic damping parameter $α$ was extracted as a function of both film thickness and temperature. We found that the damping is lowest for the intermediate film thickness of 15 nm with $α\approx 2 \cdot 10^{-3}$, where $α$ is relatively constant as a function of temperature well below the Curie temperature of the respective films.

preprint2015arXiv

Controlling the switching field in nanomagnets by means of domain-engineered antiferromagnets

Using soft x-ray spectromicroscopy, we investigate the magnetic domain structure in embedded nanomagnets defined in La$_{0.7}$Sr$_{0.3}$MnO$_3$ thin films and LaFeO$_3$/La$_{0.7}$Sr$_{0.3}$MnO$_3$ bilayers. We find that shape-controlled antiferromagnetic domain states give rise to a significant reduction of the switching field of the rectangular nanomagnets. This is discussed in the framework of competition between an intrinsic spin-flop coupling and shape anisotropy. The data demonstrates that shape effects in antiferromagnets may be used to control the magnetic properties in nanomagnets.

preprint2014arXiv

Point contact investigations of film and interface magnetoresistance of La$_{0.7}$Sr$_{0.3}$MnO$_3$ heterostructures on Nb:SrTiO$_{3}$

STM based magnetotransport measurements of epitaxial La$_{0.7}$Sr$_{0.3}$MnO$_3$ 32 nm thick films with and without an internal LaMnO$_3$ layer (0-8 nm thick) grown on Nb doped SrTiO$_3$ are presented. The measurements reveal two types of low field magnetoresistance (LFMR) with a magnitude of $\sim 0.1-1.5\%$. One LFMR contribution is identified as a conventional grain boundary/domain wall scattering through the symmetric I-V characteristics, high dependence on tip placements and insensitivity to introduction of LaMnO$_3$ layers. The other contribution originates from the reverse biased Nb doped SrTiO$_3$ interface and the interface layer of La$_{0.7}$Sr$_{0.3}$MnO$_3$. Both LFMR contributions display a field dependence indicative of a higher coercivity ($\sim$200 Oe) than the bulk film. LaMnO$_3$ layers are found to reduce the rectifying properties of the junctions, and sub micron lateral patterning by electron beam lithography enhances the diodic properties, in accordance with a proposed transport model based on the locality of the injected current.

preprint2011arXiv

Nature of polarization fatigue in BiFeO3

As a room-temperature multiferroic, BiFeO3 has been intensively investigated for both magnetoelectric devices and non-volatile ferroelectric memory applications. Both magnetoelectric and ferroelectric memory devices have the same control knob: polarization switching by an applied electric field. Due to the rhombohedral symmetry of BiFeO3, there are four ferroelastic variances and three different polarization switching events: (1) 71° switching from r1- to r3+, (2) 109° switching from r1- to r2+ (or r4+), and (3) 180o switching from r1- to r1+ (the superscript + and - stand for up and down polarization, respectively). Each switching path is coupled to a different reorientation of the BiFeO3 unit cell, and hence different coupling to the magnetic order as well as different magnitudes of switchable polarization. A degradation of the ferroelectric properties of BiFeO3 will result in losing controllability of magnetic order switching in magnetoelectric devices and capacity for information storage in ferroelectric memory devices. Especially, polarization fatigue will directly restrict the reliability of the actual devices. Hence it is important to understand the intrinsic fatigue behavior of each polarization switching path in BiFeO3 thin films. In this communication, we report polarization fatigue in BiFeO3 depending on switching path, and propose a fatigue model which will broaden our understanding of the fatigue phenomenon in low-symmetry materials.