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T. Jungk

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cond-mat.mtrl-sci cond-mat.str-el

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preprint2010arXiv

Sol-Gel Derived Ferroelectric Nanoparticles Investigated by Piezoresponse Force Microscopy

Piezoresponse force microscopy (PFM) was used to investigate the ferroelectric properties of sol-gel derived LiNbO$_3$ nanoparticles. To determine the degree of ferroelectricity we took large-area images and performed statistical image-analysis. The ferroelectric behavior of single nanoparticles was verified by poling experiments using the PFM tip. Finally we carried out simultaneous measurements of the in-plane and the out-of-plane piezoresponse of the nanoparticles, followed by measurements of the same area after rotation of the sample by 90$^{\circ}$ and 180$^{\circ}$. Such measurements basically allow to determine the direction of polarization of every single particle.

preprint2010arXiv

Translation domains in multiferroics

Translation domains differing in the phase but not in the orientation of the corresponding order parameter are resolved in two types of multiferroics. Hexagonal (h-) YMnO$_3$ is a split-order-parameter multiferroic in which commensurate ferroelectric translation domains are resolved by piezoresponse force microscopy whereas MnWO$_4$ is a joint-order-parameter multiferroic in which incommensurate magnetic translation domains are observed by optical second harmonic generation. The pronounced manifestation of the generally rather "hidden" translation domains in these multiferroics and the associated drastic reduction of symmetry emphasize that the presence of translation domains must not be neglected when discussing the physical properties and functionalities of multiferroics.

preprint2006arXiv

Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip, therefore generating a strongly inhomogeneous electric field distribution inside the sample which reaches values up to $10^8 $V/m directly underneath the apex of the tip. Although often assumed, this high electric field does not lead to an enhancement of the piezoelectric deformation of the sample. On the contrary, internal clamping of the material reduces the observed deformation compared to the theoretically expected value which depends only on the voltage thus being independent of the exact field distribution.

preprint2005arXiv

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.