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Researcher profile

Suyu Xiao

Suyu Xiao contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.ins-dethep-ex

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Published work

2 published item(s)

preprint2022arXiv

Time Resolution of the 4H-SiC PIN Detector

We address the determination of the time resolution for the $\rm 100~μm$ 4H-SiC PIN detectors fabricated by Nanjing University (NJU). The time response to $\rm β$ particles from a $\rm ^{90}$Sr source is investigated for the detection of the minimum ionizing particles (MIPs). We study the influence of different reverse voltages, which correspond to different carrier velocities and device sizes, and how this correlates with the detector capacitance. We determine a time resolution $\rm (94\pm1)~ps$ for $\rm 100~μm$ 4H-SiC PIN detector. A fast simulation software, termed RASER (RAdiation SEmiconductoR), is developed, and validated by comparing the waveform obtained from simulated and measured data. The simulated time resolution is $\rm (73\pm 1)~ps$ after considering the intrinsic leading contributions of the detector to time resolution.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Charaterization of the first prototype IHEP-NDL LGAD sensor

The timing measurement of charged particles using silicon detector is widely used in synchrotron source as X-ray detectors, in time-of-flight mass spectrometer and especially in large collider experiment. To reduce the drastically event pile-up of high-luminosity large hadron collider (HL-LHC), a new concept of 4-dimension detector including timing and positon has been proposed. One of the candidates for the 4-dimension detector is a new kind of silicon detector called Low Gain Avalanche Diode (LGAD). In China, Institute of High Energy Physics (IHEP) Chinese Academic Science cooperated with Novel Device Laboratory (NDL) at Beijing Normal University have fabricated a series of LGAD sensors. The characterization of the first prototype of IHEP-NDL sensors is presented including leakage current and sensor capacitance measurement. A test system for the time resolution of jitter term using pico-second laser and fast sampling rate oscilloscope is also setup, and the time resolution of 10 ps can be achieved with these sensors.

0 citations0 reviewsNo code linkedOpen access