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Suresh Narayanan

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3 published item(s)

preprint2022arXiv

Linking Scientific Instruments and HPC: Patterns, Technologies, Experiences

Powerful detectors at modern experimental facilities routinely collect data at multiple GB/s. Online analysis methods are needed to enable the collection of only interesting subsets of such massive data streams, such as by explicitly discarding some data elements or by directing instruments to relevant areas of experimental space. Such online analyses require methods for configuring and running high-performance distributed computing pipelines--what we call flows--linking instruments, HPC (e.g., for analysis, simulation, AI model training), edge computing (for analysis), data stores, metadata catalogs, and high-speed networks. In this article, we review common patterns associated with such flows and describe methods for instantiating those patterns. We also present experiences with the application of these methods to the processing of data from five different scientific instruments, each of which engages HPC resources for data inversion, machine learning model training, or other purposes. We also discuss implications of these new methods for operators and users of scientific facilities.

preprint2015arXiv

Co-GISAXS as a New Technique to Investigate Surface Growth Dynamics

Detailed quantitative measurement of surface dynamics during thin film growth is a major experimental challenge. Here X-ray Photon Correlation Spectroscopy with coherent hard X-rays is used in a Grazing-Incidence Small-Angle X-ray Scattering (i.e. Co-GISAXS) geometry as a new tool to investigate nanoscale surface dynamics during sputter deposition of a-Si and a-WSi$_2$ thin films. For both films, kinetic roughening during surface growth reaches a dynamic steady state at late times in which the intensity autocorrelation function $g_2$(q,t) becomes stationary. The $g_2$(q,t) functions exhibit compressed exponential behavior at all wavenumbers studied. The overall dynamics are complex, but the most surface sensitive sections of the structure factor and correlation time exhibit power law behaviors consistent with dynamical scaling.

preprint2015arXiv

Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition

The properties of artificially grown thin films are often strongly affected by the dynamic relationship between surface growth processes and subsurface structure. Coherent mixing of X-ray signals promises to provide an approach to better understand such processes. Here, we demonstrate the continuously variable mixing of surface and bulk scattering signals during real-time studies of sputter deposition of a-Si and a-WiS2 films by controlling the X-ray penetration and escape depths in coherent grazing incidence small angle X-ray scattering (Co-GISAXS). Under conditions where the X-ray signal comes from both the growth surface and the thin film bulk, oscillations in temporal correlations arise from coherent interference between scattering from stationary bulk features and from the advancing surface. We also observe evidence that elongated bulk features propagate upward at the same velocity as the surface. Additionally, a highly surface sensitive mode is demonstrated that can access the surface dynamics independently of the subsurface structure.