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Sukumar Mishra

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2 published item(s)

preprint2021arXiv

Estimating State of Charge for xEV batteries using 1D Convolutional Neural Networks and Transfer Learning

In this paper we propose a one-dimensional convolutional neural network (CNN)-based state of charge estimation algorithm for electric vehicles. The CNN is trained using two publicly available battery datasets. The influence of different types of noises on the estimation capabilities of the CNN model has been studied. Moreover, a transfer learning mechanism is proposed in order to make the developed algorithm generalize better and estimate with an acceptable accuracy when a battery with different chemical characteristics than the one used for training the model, is used. It has been observed that using transfer learning, the model can learn sufficiently well with significantly less amount of battery data. The proposed method fares well in terms of estimation accuracy, learning speed and generalization capability.

preprint2020arXiv

Multi-Terminal DC Fault Identification for MMC-HVDC Systems based on Modal Analysis -- A Localized Protection Scheme

We propose a localized protection scheme based on modal analysis in multi-terminal modular multilevel converter (MMC) based high voltage DC (HVDC) systems. The paper addresses the issues of localized protection scheme based DC fault identification, such as differentiating between external and internal faults, classification of type of fault contingency i.e., pole to pole (\textit{PTP}) or pole to ground (\textit{PTG}) for high impedance faults (HIFs) in the system. The scheme works on equivalent network of multi-terminal MMC-HVDC system for a DC fault, using phase-modal transformation to analyse line-mode and zero-mode voltage across the current limiting reactor (CLR) for different possible contingencies in the presence of fault resistance. The protection scheme is validated to be reliable for HIFs and in the presence of White Gaussian Noise (WGN) in measurement. The scheme operation is validated to be intact for varying fault location, fault resistances and system transients.