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Stephan O. Hruszkewycz

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cond-mat.mtrl-sci physics.app-ph physics.comp-ph physics.optics

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preprint2020arXiv

High-resolution three-dimensional crystalline microscopy

In this communication, we discuss how 3D information about the structure of a crystalline sample is encoded in Bragg 3DXCDI measurements. Our analysis brings to light the role of the experimental parameters in the quality of the final reconstruction. One of our salient conclusions is that these parameters can be set prior to the ptychographic 3DXCDI experiment and that the spatial resolution limit of the 3D reconstruction can be evaluated accordingly.

preprint2019arXiv

High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

We present proof-of-concept imaging measurements of a polycrystalline material that integrate the elements of conventional high-energy X-ray diffraction microscopy with coherent diffraction imaging techniques, and that can enable in-situ strain-sensitive imaging of lattice structure in ensembles of deeply embedded crystals over five decades of length scale upon full realization. Such multi-scale imaging capabilities are critical to addressing important questions in a variety of research areas such as materials science and engineering, chemistry, and solid state physics. Towards this eventual goal, the following key aspects are demonstrated: 1) high-energy Bragg coherent diffraction imaging (HE-BCDI) of sub-micron-scale crystallites at 52 keV at current third-generation synchrotron light sources, 2) HE-BCDI performed in conjunction with far-field high-energy diffraction microscopy (ff-HEDM) on the grains of a polycrystalline sample in an smoothly integrated manner, and 3) the orientation information of an ensemble of grains obtained via ff-HEDM used to perform complementary HE-BCDI on multiple Bragg reflections of a single targeted grain. These steps lay the foundation for integration of HE-BCDI, which typically provides a spatial resolution tens of nanometers, into a broad suite of well-established HEDM methods, extending HEDM beyond the few-micrometer resolution bound and into the nanoscale, and positioning the approach to take full advantage of the orders-of-magnitude improvement of X-ray coherence expected at fourth generation light sources presently being built and commissioned worldwide.