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Researcher profile

Soham Banerjee

Soham Banerjee contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Computer Visioncond-mat.mtrl-sciphysics.atom-ph

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Published work

4 published item(s)

preprint2026arXiv

A Low-Cost UAV Deep Learning Pipeline for Integrated Apple Disease Diagnosis,Freshness Assessment, and Fruit Detection

Apple orchards require timely disease detection, fruit quality assessment, and yield estimation, yet existing UAV-based systems address such tasks in isolation and often rely on costly multispectral sensors. This paper presents a unified, low-cost RGB-only UAV-based orchard intelligent pipeline integrating ResNet50 for leaf disease detection, VGG 16 for apple freshness determination, and YOLOv8 for real-time apple detection and localization. The system runs on an ESP32-CAM and Raspberry Pi, providing fully offline on-site inference without cloud support. Experiments demonstrate 98.9% accuracy for leaf disease classification, 97.4% accuracy for freshness classification, and 0.857 F1 score for apple detection. The framework provides an accessible and scalable alternative to multispectral UAV solutions, supporting practical precision agriculture on affordable hardware.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

An Improved Deep Learning Approach For Product Recognition on Racks in Retail Stores

Automated product recognition in retail stores is an important real-world application in the domain of Computer Vision and Pattern Recognition. In this paper, we consider the problem of automatically identifying the classes of the products placed on racks in retail stores from an image of the rack and information about the query/product images. We improve upon the existing approaches in terms of effectiveness and memory requirement by developing a two-stage object detection and recognition pipeline comprising of a Faster-RCNN-based object localizer that detects the object regions in the rack image and a ResNet-18-based image encoder that classifies the detected regions into the appropriate classes. Each of the models is fine-tuned using appropriate data sets for better prediction and data augmentation is performed on each query image to prepare an extensive gallery set for fine-tuning the ResNet-18-based product recognition model. This encoder is trained using a triplet loss function following the strategy of online-hard-negative-mining for improved prediction. The proposed models are lightweight and can be connected in an end-to-end manner during deployment for automatically identifying each product object placed in a rack image. Extensive experiments using Grozi-32k and GP-180 data sets verify the effectiveness of the proposed model.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Twisted electron impact single ionization coincidence cross-sections for noble gas atoms

We present the angular profiles of the triple differential cross-section (TDCS) for the (e,2e) process on the noble gas atoms, namely He (1s), Ne (2s and 2p), and Ar (3p) for the plane wave and the twisted electron impact. We develop the theoretical formalism in the first-born approximation. The present study compares the TDCS for different values of orbital angular momentum number $m$ and opening angles $θ_p$ of the twisted electron beam with that of the plane wave beam. In addition, we also investigate the TDCS for macroscopic atomic targets to explore the influence of opening angle $θ_p$ of the twisted electron beam on the TDCS. Our results show that the peaks in binary and recoil region shift from the momentum transfer direction. The results also show that for larger opening angles the peaks for $p$-type orbitals split into double-peak structures which are not observed in the plane wave results for the given kinematics. The angular profiles for averaged cross-section show the dependence of TDCS on the opening angles which are significantly different from the plane wave TDCS.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Complete Strain Mapping of Nanosheets of Tantalum Disulfide

Quasi-two-dimensional (quasi-2D) materials hold promise for future electronics because of their unique band structures that result in electronic and mechanical properties sensitive to crystal strains in all three dimensions. Quantifying crystal strain is a prerequisite to correlating it with the performance of the device, and calls for high resolution but spatially resolved rapid characterization methods. Here we show that using fly-scan nano X-ray diffraction we can accomplish a tensile strain sensitivity below 0.001% with a spatial resolution of better than 80 nm over a spatial extent of 100 $μ$m on quasi 2D flakes of 1T-TaS2. Coherent diffraction patterns were collected from a $\sim$ 100 nm thick sheet of 1T-TaS2 by scanning 12keV focused X-ray beam across and rotating the sample. We demonstrate that the strain distribution around micron and sub-micron sized 'bubbles' that are present in the sample may be reconstructed from these images. The experiments use state of the art synchrotron instrumentation, and will allow rapid and non-intrusive strain mapping of thin film samples and electronic devices based on quasi 2D materials.

0 citations0 reviewsNo code linkedOpen access