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Researcher profile

So-Young Baek

So-Young Baek contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
quant-phphysics.atom-phphysics.optics

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Published work

5 published item(s)

preprint2015arXiv

Error Compensation of Single-Qubit Gates in a Surface Electrode Ion Trap Using Composite Pulses

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high fidelity single-qubit gates for the hyperfine qubit of a $^{171}\text{Yb}^+$ ion trapped in a microfabricated surface electrode ion trap. Gate error is characterized using a randomized benchmarking protocol, and an average error per randomized Clifford group gate of $3.6(3)\times10^{-4}$ is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Scalable Digital Hardware for a Trapped Ion Quantum Computer

Many of the challenges of scaling quantum computer hardware lie at the interface between the qubits and the classical control signals used to manipulate them. Modular ion trap quantum computer architectures address scalability by constructing individual quantum processors interconnected via a network of quantum communication channels. Successful operation of such quantum hardware requires a fully programmable classical control system capable of frequency stabilizing the continuous wave lasers necessary for trapping and cooling the ion qubits, stabilizing the optical frequency combs used to drive logic gate operations on the ion qubits, providing a large number of analog voltage sources to drive the trap electrodes, and a scheme for maintaining phase coherence among all the controllers that manipulate the qubits. In this work, we describe scalable solutions to these hardware development challenges.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Experimental Test of Error-Disturbance Uncertainty Relations by Weak Measurement

We experimentally test the error-disturbance uncertainty relation (EDR) in generalized, strength-variable measurement of a single photon polarization qubit, making use of weak measurement that keeps the initial signal state practically unchanged. We demonstrate that Heisenberg's EDR is violated, yet Ozawa's and Branciard's EDRs are valid throughout the range of our measurement strength.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Single qubit manipulation in a microfabricated surface electrode ion trap

We trap individual $^{171}$Yb$^+$ ions in a surface trap microfabricated on a silicon substrate, and demonstrate a complete set of high fidelity single qubit operations for the hyperfine qubit. Trapping times exceeding 20 minutes without laser cooling, and heating rates as low as 0.8(0.1) quanta/ms indicate stable trapping conditions in these microtraps. A coherence time of more than one second, high fidelity qubit state detection and single qubit rotations are demonstrated.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

Nonlocal Dispersion Cancellation using Entangled Photons

A pair of optical pulses traveling through two dispersive media will become broadened and, as a result, the degree of coincidence between the optical pulses will be reduced. For a pair of entangled photons, however, nonlocal dispersion cancellation in which the dispersion experienced by one photon cancels the dispersion experienced by the other photon is possible. In this paper, we report an experimental demonstration of nonlocal dispersion cancellation using entangled photons. The degree of two-photon coincidence is shown to increase beyond the limit attainable without entanglement. Our results have important applications in fiber-based quantum communication and quantum metrology.

0 citations0 reviewsNo code linkedOpen access