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Sisheng Yu

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3 publications

preprint2022arXiv

Anisotropic Magnetoresistance and Nontrivial Spin Hall Magnetoresistance in Pt/αα-Fe2_2O3_3 Bilayers

To date, magnetic proximity effect (MPE) has only been conclusively observed in ferromagnet (FM) based systems. We report the observation of anomalous Hall effect and anisotropic magnetoresistance in angular dependent magnetoresistance (ADMR) measurements in Pt on antiferromagnetic (AF) αα-Fe2_2O3_3(0001) epitaxial films at 10 K, which provide evidence for the MPE. The Néel order of αα-Fe2_2O3_3 and the induced magnetization in Pt show a unique ADMR compared with all other FM and AF systems. A macrospin response model is established and can explain the AF spin configuration and all main ADMR features in the Pt/αα-Fe2_2O3_3 bilayers.

preprint2022arXiv

Electrical Switching of Tristate Antiferromagnetic Néel Order in αα-Fe2_{2}O3_{3} Epitaxial Films

The ability to manipulate antiferromagnetic (AF) moments is a key requirement for the emerging field of antiferromagnetic spintronics. Electrical switching of bi-state AF moments has been demonstrated in metallic AFs, CuMnAs and Mn2_2Au. Recently, current-induced "saw-tooth" shaped Hall resistance was reported in Pt/NiO bilayers, while its mechanism is under debate. Here, we report the first demonstration of convincing, non-decaying, step-like electrical switching of tri-state Néel order in Pt/αα-Fe2_2O3_3 bilayers. Our experimental data, together with Monte-Carlo simulations, reveal the clear mechanism of the switching behavior of αα-Fe2_2O3_3 Néel order among three stable states. We also show that the observed "saw-tooth" Hall resistance is due to an artifact of Pt, not AF switching, while the signature of AF switching is step-like Hall signals. This demonstration of electrical control of magnetic moments in AF insulator (AFI) films will greatly expand the scope of AF spintronics by leveraging the large family of AFIs.

preprint2020arXiv

Chemical Migration and Dipole Formation at van der Waals Interfaces between Magnetic Transition Metal Chalcogenides and Topological Insulators

Metal and magnetic overlayers alter the surface of the topological insulator (TI) bismuth selenide (Bi2_2Se3_3) through proximity effects but also by changing the composition and chemical structure of the Bi2_2Se3_3 sub-surface. The interface between Bi2_2Se3_3 and Mn metal or manganese selenide was explored using x-ray photoelectron spectroscopy (XPS) revealing chemical and electronic changes at the interface. Depositing Mn metal on Bi2_2Se3_3 without an external source of Se shows unexpected bonding within the Mn layer due to Mn-Se bonding as Se diffuses out of the Bi2_2Se3_3 layer into the growing Mn film. The Se out-diffusion is further evidenced by changes in Bi core levels within the Bi2_2Se3_3 layers indicating primarily Bi-Bi bonding over Bi-Se bonding. No out-diffusion of Se occurred when excess Se is supplied with Mn, indicating the importance of supplying enough chalcogen atoms with deposited metals. However, Bi2_2Se3_3 core level photoelectrons exhibited a rigid chemical shift toward higher binding energy after depositing a monolayer of MnSe2−x_{2-x}, indicating a dipole within the overlayer. Stoichiometry calculations indicated that the monolayer forms MnSe preferentially over the transition metal dichalcogenide (TMD) phase MnSe2_2, providing a consistent picture of the dipole formation in which a plane of Se anions sits above Mn cations. This study shows that chemical diffusion and dipole formation are important for Mn-Bi2_2Se3_3 and MnSe2−x_{2-x}-Bi2_2Se3_3 and should be considered carefully for TMD/TI interfaces more generally.

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