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Source author record

Sina Eftekhar

Sina Eftekhar appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.app-ph

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Published work

2 published item(s)

preprint2020arXiv

An analytical solution for nonlinear dynamics of one kind of scanning probe microscopes

The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some parameters on the dynamics of AFM is studied. The results show that the frequency response of AFM is not sensitive to the tip mass in the case of both the sample and cantilever vibration. The effect of sample vibration is studied in the case of in-phase and anti-phase vibration. The results show that although the vibration amplitude of sample is very small compared to the amplitude of cantilever, it has great effect on the resonant frequency of the cantilever.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Dynamic analysis of tapping-mode AFM with sidewall probe subjected to effects of probe mass and sidewall extension

Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is developed to explore the dynamics of AFM-SW. The effect of probe mass, sidewall extension length, and tip sample interactions on the resonance frequencies and amplitude of Micro-Cantilever is widely investigated. The obtained results of the analytical model demonstrate the significant effect of these parameters on the dynamics of AFM-SW. To verify the accuracy of the analytical model, the obtained results are compared against the simulation data of previously published works and a good agreement is observed. Resonance Frequency (RF) of cantilever clearly declines when the mass of probe is taken to account, especially in higher RFs. Besides, probe effect on RF is higher when sidewall beam is longer. Resonance frequency decreases when tip-sample interaction or probe mass is high, yet the amount of reduction is intensified when probe mass and interaction together are at higher point. An analytical method is developed to explore the dynamics of Atomic Force Microscopy with considering SideWall beam effects (AFM-SW). The effect of probe mass, sidewall extension length, and tip sample interactions on vibration of micro-cantilever is investigated. The obtained results are compared with previous literatures. The results show that Resonance Frequency (RF) of cantilever declines when the mass of probe is taken to account. Besides, probe effect on RF is higher when sidewall beam is longer. Resonance frequency decreases when tip-sample interaction or probe mass is high, yet the amount of reduction is intensified when they are at higher point.

0 citations0 reviewsNo code linkedOpen access