Source author record

Simon Zabler

Simon Zabler appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

physics.ins-det Computer Vision eess.IV physics.app-ph physics.med-ph

Catalog footprint

What is connected

4works

5topics

4close collaborators

Actions

Connect this record

Open graph Browse works

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

preprint2020arXiv

Local Fiber Orientation from X-ray Region-of-Interest Computed Tomography of large Fiber Reinforced Composite Components

The local fiber orientation is a micro-structural feature crucial for the mechanical properties of parts made from fiber reinforced polymers. It can be determined from micro-computed tomography data and subsequent quantitative analysis of the resulting 3D images. However, although being by nature non-destructive, this method so far has required to cut samples of a few millimeter edge length in order to achieve the high lateral resolution needed for the analysis. Here, we report on the successful combination of region-of-interest scanning with structure texture orientation analysis rendering the above described approach truly non-destructive. Several regions of interest in a large bearing part from the automotive industry made of fiber reinforced polymer are scanned and analyzed. Differences of these regions with respect to local fiber orientation are quantified. Moreover, consistency of the analysis based on scans at varying lateral resolutions is proved. Finally, measured and numerically simulated orientation tensors are compared for one of the regions.

preprint2020arXiv

Review and experimental verification of X-ray darkfield signal interpretations with respect to quantitative isotropic and anisotropic darkfield computed tomography

Talbot(-Lau) interferometric X-ray darkfield imaging has, over the past decade, gained substantial interest for its ability to provide insights into a sample's microstructure below the imaging resolution by means of ultra small angle scattering effects. Quantitative interpretations of such images depend on models of the signal origination process that relate the observable image contrast to underlying physical processes. A review of such models is given here and their relation to the wave optical derivations by Yashiro et al. and Lynch et al. as well as to small angle X-ray scattering is discussed. Fresnel scaling is introduced to explain the characteristic distance dependence observed in cone beam geometries. Moreover, a model describing the anisotropic signals of fibrous objects is derived. The Yashiro-Lynch model is experimentally verified both in radiographic and tomographic imaging in a monochromatic synchrotron setting, considering both the effects of material and positional dependence of the resulting darkfield contrast. The effect of varying sample-detector distance on the darkfield signal is shown to be non-negligible for tomographic imaging, yet can be largely compensated for by symmetric acquisition trajectories. The derived orientation dependence of the darkfield contrast of fibrous materials both with respect to variations in autocorrelation width and scattering cross section is experimentally validated using carbon fiber reinforced rods.

preprint2018arXiv

Optimization based evaluation of grating interferometric phase stepping series and analysis of mechanical setup instabilities

The diffraction contrast modalities accessible by X-ray grating interferometers are not imaged directly but have to be inferred from sine like signal variations occurring in a series of images acquired at varying relative positions of the interferometer's gratings. The absolute spatial translations involved in the acquisition of these phase stepping series usually lie in the range of only a few hundred nanometers, wherefore positioning errors as small as 10nm will already translate into signal uncertainties of one to ten percent in the final images if not accounted for. Classically, the relative grating positions in the phase stepping series are considered input parameters to the analysis and are, for the Fast Fourier Transform that is typically employed, required to be equidistantly distributed over multiples of the gratings' period. More general optimization based approaches with relaxed requirements on the sampling positions are often deemed too time consuming in contrast. In the following, a fast converging optimization scheme is presented simultaneously determining the phase stepping curves' parameters as well as the actually performed motions of the stepped grating, including also erroneous rotational motions which are commonly neglected. While the correction of solely the translational errors along the stepping direction is found to be sufficient with regard to the reduction of image artifacts, the possibility to also detect minute rotations about all axes proves to be a valuable tool for system calibration and monitoring. The simplicity of the provided algorithm, in particular when only considering translational errors, makes it well suitable as a standard evaluation procedure also for large image series.

preprint2012arXiv

Comparison of different sources for laboratory X-ray microscopy

This paper describes the setup of two different solutions for laboratory X-ray microscopy working with geometric magnification. One setup uses thin-film transmission targets with an optimized tungsten-layer thickness and the electron gun and optics of an electron probe micro analyzer to generate a very small X-ray source. The other setup is based on a scanning electron microscope and uses microstructured reflection targets. We also describe the structuring process for these targets. In both cases we show that resolutions of 100 nm can be achieved. Also the possibilities of computed tomography for 3D imaging are explored and we show first imaging examples of high-absorption as well as low-absorption specimens to demonstrate the capabilities of the setups.