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Researcher profile

Simon Carpentier

Simon Carpentier contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mes-hallcond-mat.softphysics.flu-dyncond-mat.mtrl-sci

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Published work

4 published item(s)

preprint2015arXiv

Out of equilibrium anomalous elastic response of a water nano-meniscus

We report the observation of a transition in the dynamical properties of water nano-menicus which dramatically change when probed at different time scales. Using a AFM mode that we name Force Feedback Microscopy, we observe this change in the simultaneous measurements, at different frequencies, of the stiffness G'(N/m), the dissipative coefficient G''(kg/sec) together with the static force. At low frequency we observe a negative stiffness as expected for capillary forces. As the measuring time approaches the microsecond, the dynamic response exhibits a transition toward a very large positive stiffness. When evaporation and condensation gradually lose efficiency, the contact line progressively becomes immobile. This transition is essentially controlled by variations of Laplace pressure.

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preprint2015arXiv

Proximity effect on hydrodynamic interaction between a sphere and a plane measured by Force Feedback Microscopy at different frequencies

In this article, we measure the viscous damping $G'',$ and the associated stiffness $G',$ of a liquid flow in sphere-plane geometry in a large frequency range. In this regime, the lubrication approximation is expected to dominate. We first measure the static force applied to the tip. This is made possible thanks to a force feedback method. Adding a sub-nanometer oscillation of the tip, we obtain the dynamic part of the interaction with solely the knowledge of the lever properties in the experimental context using a linear transformation of the amplitude and phase change. Using a Force Feedback Microscope (FFM)we are then able to measure simultaneously the static force, the stiffness and the dissipative part of the interaction in a broad frequency range using a single AFM probe. Similar measurements have been performed by the Surface Force Apparatus with a probe radius hundred times bigger. In this context the FFM can be called nano-SFA.

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preprint2014arXiv

Variable frequency characterization of interaction at nanoscale in linear dynamic AFM: an FFM primer

Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the associated dissipation. These three quantities constitute a full characterization of the interaction at nanoscale. They are measured independently, simultaneously and quantitatively at the same place. This is made possible thanks to a force feedback method that ensures the DC immobility of the tip and to the simultaneous application of a sub-nanometer oscillation to the tip. In this established linear regime, stiffness and damping are directly obtained from amplitude and phase change measurements. The needed information for this linear transformation is solely the lever properties in the experimental context. Knowledge of k, its stiffness, its damping coefficient and Q0, its first resonance frequency is shown to be sufficient in the frequency range we are here exploring. Finally, we demonstrate that this method is not restricted to the lever resonance frequency. To the contrary, this interaction characterization whose resolution is limited by the Brownian motion, can be used at any frequencies with essentially the same performances. We believe that simultaneous and independent measurements of force, stiffness and damping, out of lever resonance, at nanoscale, and within the context of linear response define a new AFM paradigm that we call Force Feedback Microscopy (FFM). This article details the use of FFM using a well known and easy to implement electrostatic interaction between a regular AFM tip and a metallic surface in air.

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preprint2013arXiv

Comparison between Atomic Force Microscopy and Force Feedback Microscopy static force curves

Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to avoid the jump to contact leads to the complete and direct measurement of the interaction force curve, including the attractive short-range van der Waals and chemical contributions. Attractive force gradients five times higher than the lever stiffness do not affect the stability of the FFM static feedback loop. The feedback loop keeps the total force acting on the AFM tip equal to zero, allowing the use of soft cantilevers as force transducers to increase the instrumental sensitivity. The attractive interactions due to the nucleation of a capillary bridge at the native oxide silicon/air interface or due to a DLVO interaction at the mica/deionized water interface have been measured. This set up, suitable for measuring directly and quantitatively interfacial forces, can be exported to a SFA (Surface Force Apparatus).

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