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Researcher profile

Shin Yoo

Shin Yoo contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Software EngineeringMachine LearningNeural and Evolutionary ComputingArtificial Intelligence

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Published work

11 published item(s)

preprint2026arXiv

Revisiting "Revisiting Neuron Coverage for DNN Testing: A Layer-Wise and Distribution-Aware Criterion": A Critical Review and Implications on DNN Coverage Testing

We present a critical review of Neural Coverage (NLC), a state-of-the-art DNN coverage criterion by Yuan et al. at ICSE 2023. While NLC proposes to satisfy eight design requirements and demonstrates strong empirical performance, we question some of their theoretical and empirical assumptions. We observe that NLC deviates from core principles of coverage criteria, such as monotonicity and test suite order independence, and could more fully account for key properties of the covariance matrix. Additionally, we note threats to the validity of the empirical study, related to the ground truth ordering of test suites. Through our empirical validation, we substantiate our claims and propose improvements for future DNN coverage metrics. Finally, we conclude by discussing the implications of these insights.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

A Bayesian Framework for Automated Debugging

Debugging takes up a significant portion of developer time. As a result, automated debugging techniques including Fault Localization (FL) and Automated Program Repair (APR) have garnered significant attention due to their potential to aid developers in debugging tasks. Despite intensive research on these subjects, we are unaware of a theoretic framework that highlights the principles behind automated debugging and allows abstract analysis of techniques. Such a framework would heighten our understanding of the endeavor and provide a way to formally analyze techniques and approaches. To this end, we first propose a Bayesian framework of understanding automated repair and find that in conjunction with a concrete statement of the objective of automated debugging, we can recover maximal fault localization formulae from prior work, as well as analyze existing APR techniques and their underlying assumptions. As a means of empirically demonstrating our framework, we further propose BAPP, a Bayesian Patch Prioritization technique that incorporates intermediate program values to analyze likely patch locations and repair actions, with its core equations being derived by our Bayesian framework. We find that incorporating program values allows BAPP to identify correct patches more precisely: when applied to the patches generated by kPAR, the rankings produced by BAPP reduce the number of required patch validation by 68% and consequently reduce the repair time by 34 minutes on average. Further, BAPP improves the precision of FL, increasing acc@5 on the studied bugs from 8 to 11. These results highlight the potential of value-cognizant automated debugging techniques, and further validates our theoretical framework. Finally, future directions that the framework suggests are provided.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases

The performance of many Fault Localisation (FL) techniques directly depends on the quality of the used test suites. Consequently, it is extremely useful to be able to precisely measure how much diagnostic power each test case can introduce when added to a test suite used for FL. Such a measure can help us not only to prioritise and select test cases to be used for FL, but also to effectively augment test suites that are too weak to be used with FL techniques. We propose FDG, a new measure of Fault Diagnosability Gain for individual test cases. The design of FDG is based on our analysis of existing metrics that are designed to prioritise test cases for better FL. Unlike other metrics, FDG exploits the ongoing FL results to emphasise the parts of the program for which more information is needed. Our evaluation of FDG with Defects4J shows that it can successfully help the augmentation of test suites for better FL. When given only a few failing test cases (2.3 test cases on average), FDG can effectively augment the given test suite by prioritising the test cases generated automatically by EvoSuite: the augmentation can improve the acc@1 and acc@10 of the FL results by 11.6x and 2.2x on average, after requiring only ten human judgements on the correctness of the assertions EvoSuite generates.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

GLAD: Neural Predicate Synthesis to Repair Omission Faults

Existing template and learning-based APR tools have successfully found patches for many benchmark faults. However, our analysis of existing results shows that omission faults pose a significant challenge to these techniques. For template based approaches, omission faults provide no location to apply templates to; for learning based approaches that formulate repair as Neural Machine Translation (NMT), omission faults similarly do not provide the faulty code to translate. To address these issues, we propose GLAD, a novel learning-based repair technique that specifically targets if-clause synthesis. GLAD does not require a faulty line as it is based on generative Language Models (LMs) instead of machine translation; consequently, it can repair omission faults. GLAD intelligently constrains the language model using a type-based grammar. Further, it efficiently reduces the validation cost by performing dynamic ranking of candidate patches using a debugger. Thanks to the shift from translation to synthesis, GLAD is highly orthogonal to existing techniques: GLAD can correctly fix 16 Defects4J v1.2 faults that previous NMT-based techniques could not, while maintaining a reasonable runtime cost, underscoring its utility as an APR tool and potential to complement existing tools in practice. An inspection of the bugs that GLAD fixes reveals that GLAD can quickly generate expressions that would be challenging for other techniques.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Predictive Mutation Analysis via Natural Language Channel in Source Code

Mutation analysis can provide valuable insights into both System Under Test (SUT) and its test suite. However, it is not scalable due to the cost of building and testing a large number of mutants. Predictive Mutation Testing (PMT) has been proposed to reduce the cost of mutation testing, but it can only provide statistical inference about whether a mutant will be killed or not by the entire test suite. We propose Seshat, a Predictive Mutation Analysis (PMA) technique that can accurately predict the entire kill matrix, not just the mutation score of the given test suite. Seshat exploits the natural language channel in code, and learns the relationship between the syntactic and semantic concepts of each test case and the mutants it can kill, from a given kill matrix. The learnt model can later be used to predict the kill matrices for subsequent versions of the program, even after both the source and test code have changed significantly. Empirical evaluation using the programs in the Defects4J shows that Seshat can predict kill matrices with the average F-score of 0.83 for versions that are up to years apart. This is an improvement of F-score by 0.14 and 0.45 point over the state-of-the-art predictive mutation testing technique, and a simple coverage based heuristic, respectively. Seshat also performs as well as PMT for the prediction of mutation scores only. Once Seshat trains its model using a concrete mutation analysis, the subsequent predictions made by Seshat are on average 39 times faster than actual test-based analysis.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Ahead of Time Mutation Based Fault Localisation using Statistical Inference

Mutation analysis can effectively capture the dependency between source code and test results. This has been exploited by Mutation Based Fault Localisation (MBFL) techniques. However, MBFL techniques suffer from the need to expend the high cost of mutation analysis after the observation of failures, which may present a challenge for its practical adoption. We introduce SIMFL (Statistical Inference for Mutation-based Fault Localisation), an MBFL technique that allows users to perform the mutation analysis in advance before a failure is observed, allowing the amortisation of the analysis cost. SIMFL uses mutants as artificial faults and aims to learn the failure patterns among test cases against different locations of mutations. Once a failure is observed, SIMFL requires either almost no or very small additional cost for analysis, depending on the used inference model. An empirical evaluation using Defects4J shows that SIMFL can successfully localise up to 113 out of 203 studied faults (55%) at the top, and 159 (78%) faults within the top five, significantly outperforming existing MBFL techniques while using the results of mutation analysis that has been undertaken before the test failure. The amortised cost of mutation analysis can be further reduced by mutation sampling: SIMFL retains 80% of its localisation accuracy at the top rank when using only 10% of generated mutants, compared to results obtained without sampling.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Genetic Improvement @ ICSE 2020

Following Prof. Mark Harman of Facebook's keynote and formal presentations (which are recorded in the proceedings) there was a wide ranging discussion at the eighth international Genetic Improvement workshop, GI-2020 @ ICSE (held as part of the 42nd ACM/IEEE International Conference on Software Engineering on Friday 3rd July 2020). Topics included industry take up, human factors, explainabiloity (explainability, justifyability, exploitability) and GI benchmarks. We also contrast various recent online approaches (e.g. SBST 2020) to holding virtual computer science conferences and workshops via the WWW on the Internet without face-2-face interaction. Finally we speculate on how the Coronavirus Covid-19 Pandemic will affect research next year and into the future.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Reducing DNN Labelling Cost using Surprise Adequacy: An Industrial Case Study for Autonomous Driving

Deep Neural Networks (DNNs) are rapidly being adopted by the automotive industry, due to their impressive performance in tasks that are essential for autonomous driving. Object segmentation is one such task: its aim is to precisely locate boundaries of objects and classify the identified objects, helping autonomous cars to recognise the road environment and the traffic situation. Not only is this task safety critical, but developing a DNN based object segmentation module presents a set of challenges that are significantly different from traditional development of safety critical software. The development process in use consists of multiple iterations of data collection, labelling, training, and evaluation. Among these stages, training and evaluation are computation intensive while data collection and labelling are manual labour intensive. This paper shows how development of DNN based object segmentation can be improved by exploiting the correlation between Surprise Adequacy (SA) and model performance. The correlation allows us to predict model performance for inputs without manually labelling them. This, in turn, enables understanding of model performance, more guided data collection, and informed decisions about further training. In our industrial case study the technique allows cost savings of up to 50% with negligible evaluation inaccuracy. Furthermore, engineers can trade off cost savings versus the tolerable level of inaccuracy depending on different development phases and scenarios.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

SINVAD: Search-based Image Space Navigation for DNN Image Classifier Test Input Generation

The testing of Deep Neural Networks (DNNs) has become increasingly important as DNNs are widely adopted by safety critical systems. While many test adequacy criteria have been suggested, automated test input generation for many types of DNNs remains a challenge because the raw input space is too large to randomly sample or to navigate and search for plausible inputs. Consequently, current testing techniques for DNNs depend on small local perturbations to existing inputs, based on the metamorphic testing principle. We propose new ways to search not over the entire image space, but rather over a plausible input space that resembles the true training distribution. This space is constructed using Variational Autoencoders (VAEs), and navigated through their latent vector space. We show that this space helps efficiently produce test inputs that can reveal information about the robustness of DNNs when dealing with realistic tests, opening the field to meaningful exploration through the space of highly structured images.

0 citations0 reviewsNo code linkedOpen access
preprint2018arXiv

Guiding Deep Learning System Testing using Surprise Adequacy

Deep Learning (DL) systems are rapidly being adopted in safety and security critical domains, urgently calling for ways to test their correctness and robustness. Testing of DL systems has traditionally relied on manual collection and labelling of data. Recently, a number of coverage criteria based on neuron activation values have been proposed. These criteria essentially count the number of neurons whose activation during the execution of a DL system satisfied certain properties, such as being above predefined thresholds. However, existing coverage criteria are not sufficiently fine grained to capture subtle behaviours exhibited by DL systems. Moreover, evaluations have focused on showing correlation between adversarial examples and proposed criteria rather than evaluating and guiding their use for actual testing of DL systems. We propose a novel test adequacy criterion for testing of DL systems, called Surprise Adequacy for Deep Learning Systems (SADL), which is based on the behaviour of DL systems with respect to their training data. We measure the surprise of an input as the difference in DL system's behaviour between the input and the training data (i.e., what was learnt during training), and subsequently develop this as an adequacy criterion: a good test input should be sufficiently but not overtly surprising compared to training data. Empirical evaluation using a range of DL systems from simple image classifiers to autonomous driving car platforms shows that systematic sampling of inputs based on their surprise can improve classification accuracy of DL systems against adversarial examples by up to 77.5% via retraining.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Test Set Diameter: Quantifying the Diversity of Sets of Test Cases

A common and natural intuition among software testers is that test cases need to differ if a software system is to be tested properly and its quality ensured. Consequently, much research has gone into formulating distance measures for how test cases, their inputs and/or their outputs differ. However, common to these proposals is that they are data type specific and/or calculate the diversity only between pairs of test inputs, traces or outputs. We propose a new metric to measure the diversity of sets of tests: the test set diameter (TSDm). It extends our earlier, pairwise test diversity metrics based on recent advances in information theory regarding the calculation of the normalized compression distance (NCD) for multisets. An advantage is that TSDm can be applied regardless of data type and on any test-related information, not only the test inputs. A downside is the increased computational time compared to competing approaches. Our experiments on four different systems show that the test set diameter can help select test sets with higher structural and fault coverage than random selection even when only applied to test inputs. This can enable early test design and selection, prior to even having a software system to test, and complement other types of test automation and analysis. We argue that this quantification of test set diversity creates a number of opportunities to better understand software quality and provides practical ways to increase it.

0 citations0 reviewsNo code linkedOpen access