Source author record

Sergey Zhukov

Sergey Zhukov appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

physics.app-ph cond-mat.mes-hall cond-mat.mtrl-sci physics.optics

Catalog footprint

What is connected

3works

4topics

4close collaborators

Actions

Connect this record

Open graph Browse works

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

preprint2022arXiv

Dynamic scaling properties of multistep polarization response in ferroelectrics

Ferroelectrics are multifunctional smart materials finding applications in sensor technology, micromechanical actuation, digital information storage etc. Their most fundamental property is the ability of polarization switching under applied electric field. In particular, understanding of switching kinetics is essential for digital information storage. In this regard, scaling properties of the temporal polarization response are well-known for 180°-switching processes in ferroelectrics characterized by a unique field-dependent local switching time. Unexpectedly, these properties were now observed in multiaxial polycrystalline ferroelectrics, exhibiting a number of parallel and sequential non-180°-switching processes with distinct switching times. This behaviour can be explained by a combination of the multistep stochastic mechanism and the inhomogeneous field mechanism models of polarization reversal. Scaling properties are predicted for polycrystalline ferroelectrics of tetragonal, rhombohedral and orthorhombic symmetries and exemplarily demonstrated by measurements of polarization kinetics in (K,Na)NbO3-based ferroelectric ceramic over a timescale of 7 orders of magnitude. Dynamic scaling properties allow insight into the microscopic switching mechanisms, on the one hand, and into statistical material characteristics, on the other hand, providing thereby the description of temporal polarization with high accuracy. The gained deeper insight into the mechanisms of multistep polarization switching is crucial for future ultrafast and multilevel digital information storage.

preprint2022arXiv

Polarization-resolving graphene-based mid-infrared detector

The ability to resolve the polarization of light with on-chip devices represents an urgent problem in optoelectronics. The detectors with polarization resolution demonstrated so far mostly require multiple oriented detectors or movable external polarizers. Here, we experimentally demonstrate the feasibility to resolve the polarization of mid-infrared light with a single chemical-vapor-deposited graphene-channel device with dissimilar metal contacts. This possibility stems from an unusual dependence of photoresponse at graphene-metal junctions on gate voltage and polarization angle. Namely, there exist certain gate voltages providing the polarization-insensitive signal; operation at these voltages can be used for power calibration of the detector. At other gate voltages, the detector features very strong polarization sensitivity, with the ratio of signals for two orthogonal polarizations reaching ~10. Operation at these voltages can provide information about polarization angles, after the power calibration. We show that such unusual gate- and polarization-dependence of photosignal can appear upon competition of isotropic and anisotropic photovoltage generation pathways and discuss the possible physical candidates.

preprint2021arXiv

Topological phase singularities in atomically thin high-refractive-index materials

Atomically thin transition metal dichalcogenides (TMDCs) present a promising platform for numerous photonic applications due to excitonic spectral features, possibility to tune their constants by external gating, doping, or light, and mechanical stability. Utilization of such materials for sensing or optical modulation purposes would require a clever optical design, as by itself the 2D materials can offer only a small optical phase delay - consequence of the atomic thickness. To address this issue, we combine films of 2D semiconductors which exhibit excitonic lines with the Fabry-Perot resonators of the standard commercial SiO$_2$/Si substrate, in order to realize topological phase singularities in reflection. Around these singularities, reflection spectra demonstrate rapid phase changes while the structure behaves as a perfect absorber. Furthermore, we demonstrate that such topological phase singularities are ubiquitous for the entire class of atomically thin TMDCs and other high-refractive-index materials, making it a powerful tool for phase engineering in flat optics. As a practical demonstration, we employ PdSe$_2$ topological phase singularities for a refractive index sensor and demonstrate its superior phase sensitivity compared to typical surface plasmon resonance sensors.