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Sergej Orlov

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Published work

3 published item(s)

preprint2014arXiv

Towards an optical far-field measurement of higher-order multipole contributions to the scattering response of nanoparticles

We experimentally show an all-optical multipolar decomposition of the lowest-order Eigenmodes of a single gold nanoprism using azimuthally and radially polarized cylindrical vector beams. By scanning the particle through these tailored field distributions, the multipolar character of the Eigenmodes gets encoded into 2D-scanning intensity maps even for higher-order contributions to the Eigenmode that are too weak to be discerned in the direct far-field scattering response. This method enables a detailed optical mode analysis of individual nanoparticles.

preprint2013arXiv

Geometric spin Hall effect of light in tightly focused polarization tailored light beams

Recently, it was shown that a non-zero transverse angular momentum manifests itself in a polarization dependent intensity shift of the barycenter of a paraxial light beam [A. Aiello et al., Phys. Rev. Lett. 103, 100401 (2009)]. The underlying effect is phenomenologically similar to the spin Hall effect of light, but does not depend on the specific light-matter interaction and can be interpreted as a purely geometric effect. Thus, it was named the geometric spin Hall effect of light. Here, we experimentally investigate the appearance of this effect in tightly focused vector-beams. We use an experimental nano-probing technique in combination with a reconstruction algorithm to verify the relative shifts of the components of the electric energy density in the focal plane, which are linked to the intensity shift. By that, we experimentally demonstrate the geometric spin Hall effect of light in a focused light beam.

preprint2013arXiv

Nanointerferometric Amplitude and Phase Reconstruction of Tightly Focused Vector Beams

Highly confined vectorial electromagnetic field distributions represent an excellent tool for detailed studies in nano-optics and high resolution microscopy, such as nonlinear microscopy, advanced fluorescence imaging or nanoplasmonics. Such field distributions can be generated, for instance, by tight focussing of polarized light beams. To guarantee high quality and resolution in the investigation of objects with sub-wavelength dimensions, the precise knowledge of the spatial distribution of the exciting vectorial field is of utmost importance. Full-field reconstruction methods presented so far involved, for instance, complex near-field techniques. Here, we demonstrate a simple and straight-forward to implement measurement scheme and reconstruction algorithm based on the scattering signal of a single spherical nanoparticle as a field-probe. We are able to reconstruct the amplitudes of the individual focal field components as well as their relative phase distributions with sub-wavelength resolution from a single scan measurement without the need for polarization analysis of the scattered light. This scheme can help to improve modern microscopy and nanoscopy techniques.