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Researcher profile

Sean M. Collins

Sean M. Collins contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-scicond-mat.mes-hallmath.NANumerical Analysisphysics.app-ph

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Published work

3 published item(s)

preprint2026arXiv

Structural and magnetic properties of co-sputtered epitaxial Fe-Sn kagome thin films

In recent years the intermetallic alloys of Fe and Sn have gained significant interest due to a rich variety of magnetic properties present in these materials. The crystal Fe3Sn2 is a frustrated ferromagnet, while the crystallographically similar FeSn, which differs only by the stacking sequence of its Fe-containining kagome and stanene layers, is an antiferromagnet. Thin-film growth techniques such as magnetron sputtering allow for these different stoichiometric compositions to be grown through adjustments of the rate of deposition of the individual Fe and Sn sources, while all other conditions remain constant. Here, we report the production of high quality epitaxial thin films of Fe$_3$Sn$_2$ and FeSn on sapphire with a Pt seed layer, as well as a mixed phase containing intergrowths of both crystals, all of which we have characterized using both X-ray and four-dimensional scanning transmission electron microscopy (4D-STEM) methods. The resulting crystallographic phase content is compared to the results of magnetization measurements, with correspondence between the predicted ferromagnetic phase content and the resulting magnetization. Further magnetic properties of these films can then also be compared, leading to the discovery of a unique behavior in the temperature dependent coercivity within highly mixed phase alloys, a feature that is absent in either pure Fe3Sn2 and FeSn.

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preprint2022arXiv

Unveiling the interaction mechanisms of electron and X-ray radiation with halide perovskite semiconductors using scanning nano-probe diffraction

The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction techniques, which can investigate physical properties on the nanoscale, we perform studies of the interaction of electron and X-ray radiation with state-of-the-art (FA$_{0.79}$MA$_{0.16}$Cs$_{0.05}$)Pb(I$_{0.83}$Br$_{0.17}$)$_3$ hybrid halide perovskite films (FA, formamidinium; MA, methylammonium). We track the changes in the local crystal structure as a function of fluence using scanning electron diffraction and synchrotron nano X-ray diffraction techniques. We identify perovskite grains from which additional reflections, corresponding to PbBr$_2$, appear as a crystalline degradation phase after fluences of ~200 e$^-$Å$^{-2}$. These changes are concomitant with the formation of small PbI$_2$ crystallites at the adjacent high-angle grain boundaries, with the formation of pinholes, and with a phase transition from tetragonal to cubic. A similar degradation pathway is caused by photon irradiation in nano-X-ray diffraction, suggesting common underlying mechanisms. Our approach explores the radiation limits of these materials and provides a description of the degradation pathways on the nanoscale. Addressing high-angle grain boundaries will be critical for the further improvement of halide polycrystalline film stability, especially for applications vulnerable to high-energy radiation such as space photovoltaics.

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preprint2020arXiv

Scanning electron diffraction tomography of strain

Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of suitable experimental techniques and data analysis tools. Scanning electron diffraction has emerged as a powerful tool for obtaining two-dimensional maps of strain components perpendicular to the incident electron beam direction. Extension of this method to recover the full three-dimensional strain tensor field has been restricted though by the absence of a formal framework for tensor tomography using such data. Here, we show that it is possible to reconstruct the full non-symmetric strain tensor field as the solution to an ill-posed tensor tomography inverse problem. We then demonstrate the properties of this tomography problem both analytically and computationally, highlighting why incorporating precession to perform scanning precession electron diffraction may be important. We establish a general framework for non-symmetric tensor tomography and demonstrate computationally its applicability for achieving strain tomography with scanning precession electron diffraction data.

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