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Saeejith Nair

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Published work

2 published item(s)

preprint2022arXiv

CellDefectNet: A Machine-designed Attention Condenser Network for Electroluminescence-based Photovoltaic Cell Defect Inspection

Photovoltaic cells are electronic devices that convert light energy to electricity, forming the backbone of solar energy harvesting systems. An essential step in the manufacturing process for photovoltaic cells is visual quality inspection using electroluminescence imaging to identify defects such as cracks, finger interruptions, and broken cells. A big challenge faced by industry in photovoltaic cell visual inspection is the fact that it is currently done manually by human inspectors, which is extremely time consuming, laborious, and prone to human error. While deep learning approaches holds great potential to automating this inspection, the hardware resource-constrained manufacturing scenario makes it challenging for deploying complex deep neural network architectures. In this work, we introduce CellDefectNet, a highly efficient attention condenser network designed via machine-driven design exploration specifically for electroluminesence-based photovoltaic cell defect detection on the edge. We demonstrate the efficacy of CellDefectNet on a benchmark dataset comprising of a diversity of photovoltaic cells captured using electroluminescence imagery, achieving an accuracy of ~86.3% while possessing just 410K parameters (~13$\times$ lower than EfficientNet-B0, respectively) and ~115M FLOPs (~12$\times$ lower than EfficientNet-B0) and ~13$\times$ faster on an ARM Cortex A-72 embedded processor when compared to EfficientNet-B0.

preprint2022arXiv

MAPLE-Edge: A Runtime Latency Predictor for Edge Devices

Neural Architecture Search (NAS) has enabled automatic discovery of more efficient neural network architectures, especially for mobile and embedded vision applications. Although recent research has proposed ways of quickly estimating latency on unseen hardware devices with just a few samples, little focus has been given to the challenges of estimating latency on runtimes using optimized graphs, such as TensorRT and specifically for edge devices. In this work, we propose MAPLE-Edge, an edge device-oriented extension of MAPLE, the state-of-the-art latency predictor for general purpose hardware, where we train a regression network on architecture-latency pairs in conjunction with a hardware-runtime descriptor to effectively estimate latency on a diverse pool of edge devices. Compared to MAPLE, MAPLE-Edge can describe the runtime and target device platform using a much smaller set of CPU performance counters that are widely available on all Linux kernels, while still achieving up to +49.6% accuracy gains against previous state-of-the-art baseline methods on optimized edge device runtimes, using just 10 measurements from an unseen target device. We also demonstrate that unlike MAPLE which performs best when trained on a pool of devices sharing a common runtime, MAPLE-Edge can effectively generalize across runtimes by applying a trick of normalizing performance counters by the operator latency, in the measured hardware-runtime descriptor. Lastly, we show that for runtimes exhibiting lower than desired accuracy, performance can be boosted by collecting additional samples from the target device, with an extra 90 samples translating to gains of nearly +40%.