Researcher profile

S. M. Hornett

S. M. Hornett contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2016arXiv

Non-invasive, near-field terahertz imaging of hidden objects using a single pixel detector

Terahertz (THz) imaging has the ability to see through otherwise opaque materials. However, due to the long wavelengths of THz radiation (λ=300μm at 1THz), far-field THz imaging techniques are heavily outperformed by optical imaging in regards to the obtained resolution. In this work we demonstrate near-field THz imaging with a single-pixel detector. We project a time-varying optical mask onto a silicon wafer which is used to spatially modulate a pulse of THz radiation. The far-field transmission corresponding to each mask is recorded by a single element detector and this data is used to reconstruct the image of an object placed on the far side of the silicon wafer. We demonstrate a proof of principal application where we image a printed circuit board on the underside of a 115μm thick silicon wafer with ~100μm (λ/4) resolution. With subwavelength resolution and the inherent sensitivity to local conductivity provided by the THz probe frequencies, we show that it is possible to detect fissures in the circuitry wiring of a few microns in size. Imaging systems of this type could have other uses where non-invasive measurement or imaging of concealed structures with high resolution is necessary, such as in semiconductor manufacturing or in bio-imaging.

preprint2012arXiv

Non-linear resistivity and heat dissipation in monolayer graphene

We have experimentally studied the nonlinear nature of electrical conduction in monolayer graphene devices on silica substrates. This nonlinearity manifests itself as a nonmonotonic dependence of the differential resistance on applied DC voltage bias across the sample. At temperatures below ~70K, the differential resistance exhibits a peak near zero bias that can be attributed to self-heating of the charge carriers. We show that the shape of this peak arises from a combination of different energy dissipation mechanisms of the carriers. The energy dissipation at higher carrier temperatures depends critically on the length of the sample. For samples longer than 10um the heat loss is shown to be determined by optical phonons at the silica-graphene interface.

preprint2010arXiv

Hot phonon decay in supported and suspended exfoliated graphene

Near infrared pump-probe spectroscopy has been used to measure the ultrafast dynamics of photoexcited charge carriers in monolayer and multilayer graphene. We observe two decay processes occurring on 100 fs and 2 ps timescales. The first is attributed to the rapid electron-phonon thermalisation in the system. The second timescale is found to be due to the slow decay of hot phonons. Using a simple theoretical model we calculate the hot phonon decay rate and show that it is significantly faster in monolayer flakes than in multilayer ones. In contrast to recent claims, we show that this enhanced decay rate is not due to the coupling to substrate phonons, since we have also seen the same effect in suspended flakes. Possible intrinsic decay mechanisms that could cause such an effect are discussed.